WAVEFORM MEMORY METHOD
PURPOSE:To make it possible to store and regenerate a desired waveform part in the max. detailed manner, by successively altering each sampling clock to a sampling clock having frequency of two times the original one when the memory content of a memory circuit is insufficient with respect to an obse...
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creator | OOTA TOSHINORI |
description | PURPOSE:To make it possible to store and regenerate a desired waveform part in the max. detailed manner, by successively altering each sampling clock to a sampling clock having frequency of two times the original one when the memory content of a memory circuit is insufficient with respect to an observation waveform. CONSTITUTION:When the part of a period Tl wherein the C1-point of a signal 7 is set to a start point and the C2-point thereof is set to a finish point is sampled, N-many data corresponding to memory capacity N are sampled by the sampling clock train of the highest speed cycle t0 possessed by an apparatus. In a case not reaching the C2-point at the finish time of the period Tl until N data are sampled, sampling is performed at a cycle t1=2t0. In a case not reaching the C2-point at the finish time of the period Tl even by said sampling, sampling is performed at a sampling clock having a cycle t2=2t1. Hereinafter, when the cycle of the sampling clock is altered, the cycle is made twice the previous cycle in the same way and, in a case exceeding the C2-point at the finish point of time of sampling, said sampling operation is finished. By the above-mentioned procedure, sampling can be performed in such a state that the C2-point is present in the latter half of memory capacity. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS62238468A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS62238468A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS62238468A3</originalsourceid><addsrcrecordid>eNrjZBALdwxzdfMP8lXwdfX1D4oEUiEe_i48DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTeKyDYzMjI2MLEzMLRmBg1AMs3H6Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>WAVEFORM MEMORY METHOD</title><source>esp@cenet</source><creator>OOTA TOSHINORI</creator><creatorcontrib>OOTA TOSHINORI</creatorcontrib><description>PURPOSE:To make it possible to store and regenerate a desired waveform part in the max. detailed manner, by successively altering each sampling clock to a sampling clock having frequency of two times the original one when the memory content of a memory circuit is insufficient with respect to an observation waveform. CONSTITUTION:When the part of a period Tl wherein the C1-point of a signal 7 is set to a start point and the C2-point thereof is set to a finish point is sampled, N-many data corresponding to memory capacity N are sampled by the sampling clock train of the highest speed cycle t0 possessed by an apparatus. In a case not reaching the C2-point at the finish time of the period Tl until N data are sampled, sampling is performed at a cycle t1=2t0. In a case not reaching the C2-point at the finish time of the period Tl even by said sampling, sampling is performed at a sampling clock having a cycle t2=2t1. Hereinafter, when the cycle of the sampling clock is altered, the cycle is made twice the previous cycle in the same way and, in a case exceeding the C2-point at the finish point of time of sampling, said sampling operation is finished. By the above-mentioned procedure, sampling can be performed in such a state that the C2-point is present in the latter half of memory capacity.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; STATIC STORES ; TESTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871019&DB=EPODOC&CC=JP&NR=S62238468A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871019&DB=EPODOC&CC=JP&NR=S62238468A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OOTA TOSHINORI</creatorcontrib><title>WAVEFORM MEMORY METHOD</title><description>PURPOSE:To make it possible to store and regenerate a desired waveform part in the max. detailed manner, by successively altering each sampling clock to a sampling clock having frequency of two times the original one when the memory content of a memory circuit is insufficient with respect to an observation waveform. CONSTITUTION:When the part of a period Tl wherein the C1-point of a signal 7 is set to a start point and the C2-point thereof is set to a finish point is sampled, N-many data corresponding to memory capacity N are sampled by the sampling clock train of the highest speed cycle t0 possessed by an apparatus. In a case not reaching the C2-point at the finish time of the period Tl until N data are sampled, sampling is performed at a cycle t1=2t0. In a case not reaching the C2-point at the finish time of the period Tl even by said sampling, sampling is performed at a sampling clock having a cycle t2=2t1. Hereinafter, when the cycle of the sampling clock is altered, the cycle is made twice the previous cycle in the same way and, in a case exceeding the C2-point at the finish point of time of sampling, said sampling operation is finished. By the above-mentioned procedure, sampling can be performed in such a state that the C2-point is present in the latter half of memory capacity.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBALdwxzdfMP8lXwdfX1D4oEUiEe_i48DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTeKyDYzMjI2MLEzMLRmBg1AMs3H6Q</recordid><startdate>19871019</startdate><enddate>19871019</enddate><creator>OOTA TOSHINORI</creator><scope>EVB</scope></search><sort><creationdate>19871019</creationdate><title>WAVEFORM MEMORY METHOD</title><author>OOTA TOSHINORI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS62238468A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1987</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OOTA TOSHINORI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OOTA TOSHINORI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>WAVEFORM MEMORY METHOD</title><date>1987-10-19</date><risdate>1987</risdate><abstract>PURPOSE:To make it possible to store and regenerate a desired waveform part in the max. detailed manner, by successively altering each sampling clock to a sampling clock having frequency of two times the original one when the memory content of a memory circuit is insufficient with respect to an observation waveform. CONSTITUTION:When the part of a period Tl wherein the C1-point of a signal 7 is set to a start point and the C2-point thereof is set to a finish point is sampled, N-many data corresponding to memory capacity N are sampled by the sampling clock train of the highest speed cycle t0 possessed by an apparatus. In a case not reaching the C2-point at the finish time of the period Tl until N data are sampled, sampling is performed at a cycle t1=2t0. In a case not reaching the C2-point at the finish time of the period Tl even by said sampling, sampling is performed at a sampling clock having a cycle t2=2t1. Hereinafter, when the cycle of the sampling clock is altered, the cycle is made twice the previous cycle in the same way and, in a case exceeding the C2-point at the finish point of time of sampling, said sampling operation is finished. By the above-mentioned procedure, sampling can be performed in such a state that the C2-point is present in the latter half of memory capacity.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING |
title | WAVEFORM MEMORY METHOD |
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