JPS6129648B
A thermopile type detector which is constituted by an electrically insulating film, a thermopile supported on the film, a semiconductor substrate supporting the film, and a temperature sensing element on the surface of the substrate on which the film is supported and in the neighborhood of a cold ju...
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| creator | TOMITA KATSUHIKO SHIMIZU TETSUO BANDO MASAICHI |
| description | A thermopile type detector which is constituted by an electrically insulating film, a thermopile supported on the film, a semiconductor substrate supporting the film, and a temperature sensing element on the surface of the substrate on which the film is supported and in the neighborhood of a cold junction of the thermopile. The temperature on the substrate immediately adjacent a cold junction of the thermopile can be measured for use in compensating the output of the thermopile for the changes in temperature of the cold junction. The temperature sensing element can be a semiconductor material such as a diode or a transistor forming a semiconductor with the substrate. |
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The temperature on the substrate immediately adjacent a cold junction of the thermopile can be measured for use in compensating the output of the thermopile for the changes in temperature of the cold junction. The temperature sensing element can be a semiconductor material such as a diode or a transistor forming a semiconductor with the substrate.</description><language>eng</language><subject>COLORIMETRY ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; RADIATION PYROMETRY ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>1986</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860708&DB=EPODOC&CC=JP&NR=S6129648B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860708&DB=EPODOC&CC=JP&NR=S6129648B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOMITA KATSUHIKO</creatorcontrib><creatorcontrib>SHIMIZU TETSUO</creatorcontrib><creatorcontrib>BANDO MASAICHI</creatorcontrib><title>JPS6129648B</title><description>A thermopile type detector which is constituted by an electrically insulating film, a thermopile supported on the film, a semiconductor substrate supporting the film, and a temperature sensing element on the surface of the substrate on which the film is supported and in the neighborhood of a cold junction of the thermopile. The temperature on the substrate immediately adjacent a cold junction of the thermopile can be measured for use in compensating the output of the thermopile for the changes in temperature of the cold junction. The temperature sensing element can be a semiconductor material such as a diode or a transistor forming a semiconductor with the substrate.</description><subject>COLORIMETRY</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1986</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOD2Cgg2MzSyNDOxcOJhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFIOpyMjIlSBACHxByB</recordid><startdate>19860708</startdate><enddate>19860708</enddate><creator>TOMITA KATSUHIKO</creator><creator>SHIMIZU TETSUO</creator><creator>BANDO MASAICHI</creator><scope>EVB</scope></search><sort><creationdate>19860708</creationdate><title>JPS6129648B</title><author>TOMITA KATSUHIKO ; SHIMIZU TETSUO ; BANDO MASAICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS6129648BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1986</creationdate><topic>COLORIMETRY</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>TOMITA KATSUHIKO</creatorcontrib><creatorcontrib>SHIMIZU TETSUO</creatorcontrib><creatorcontrib>BANDO MASAICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOMITA KATSUHIKO</au><au>SHIMIZU TETSUO</au><au>BANDO MASAICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JPS6129648B</title><date>1986-07-08</date><risdate>1986</risdate><abstract>A thermopile type detector which is constituted by an electrically insulating film, a thermopile supported on the film, a semiconductor substrate supporting the film, and a temperature sensing element on the surface of the substrate on which the film is supported and in the neighborhood of a cold junction of the thermopile. The temperature on the substrate immediately adjacent a cold junction of the thermopile can be measured for use in compensating the output of the thermopile for the changes in temperature of the cold junction. The temperature sensing element can be a semiconductor material such as a diode or a transistor forming a semiconductor with the substrate.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS RADIATION PYROMETRY TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | JPS6129648B |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T05%3A04%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TOMITA%20KATSUHIKO&rft.date=1986-07-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS6129648BB2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |