SEMICONDUCTOR MEMORY DEVICE

PURPOSE:To reduce a necessary area and improve a reliability by a method wherein an insulation film and a conductive film are laminated on the surface of a column shape part to form a capacitance part. CONSTITUTION:Gold is implanted into the position in a silicon substrate where a column shape part...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YOSHIHIRO NAOJI, NISHINO YOICHI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YOSHIHIRO NAOJI
NISHINO YOICHI
description PURPOSE:To reduce a necessary area and improve a reliability by a method wherein an insulation film and a conductive film are laminated on the surface of a column shape part to form a capacitance part. CONSTITUTION:Gold is implanted into the position in a silicon substrate where a column shape part is to be formed by a converged ion beam method. The size of a gold-silicon alloy region can be controlled so as to have a diameter within a region about 0.2-10mum by regulating the diameter and the intensity of the ion beam. If the substrate is heated to the temperature not less than 370 deg.C, which is the eutectic temperature of gold-silicon alloy, in a cylinder type reaction furnace, a gold-silicon eutectic alloy liquid drop is formed at the position where the gold is implanted. If the substrate is placed in the reaction furnace whose inside temperature is maintained at 375 deg.C and SiCl4/H2 system mixture gas is introduced and made to react by a photoexcitation method, supersaturated silicon is deposited from the alloy liquid drop to make a column shape silicon single crystal grow. With this constitution, a necessary area can be significantly reduced and an integration density can be improved.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS61258467A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS61258467A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS61258467A3</originalsourceid><addsrcrecordid>eNrjZJAOdvX1dPb3cwl1DvEPUvB19fUPilRwcQ3zdHblYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZoZGphYmZuaOxsSoAQBt3CEQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SEMICONDUCTOR MEMORY DEVICE</title><source>esp@cenet</source><creator>YOSHIHIRO NAOJI ; NISHINO YOICHI</creator><creatorcontrib>YOSHIHIRO NAOJI ; NISHINO YOICHI</creatorcontrib><description>PURPOSE:To reduce a necessary area and improve a reliability by a method wherein an insulation film and a conductive film are laminated on the surface of a column shape part to form a capacitance part. CONSTITUTION:Gold is implanted into the position in a silicon substrate where a column shape part is to be formed by a converged ion beam method. The size of a gold-silicon alloy region can be controlled so as to have a diameter within a region about 0.2-10mum by regulating the diameter and the intensity of the ion beam. If the substrate is heated to the temperature not less than 370 deg.C, which is the eutectic temperature of gold-silicon alloy, in a cylinder type reaction furnace, a gold-silicon eutectic alloy liquid drop is formed at the position where the gold is implanted. If the substrate is placed in the reaction furnace whose inside temperature is maintained at 375 deg.C and SiCl4/H2 system mixture gas is introduced and made to react by a photoexcitation method, supersaturated silicon is deposited from the alloy liquid drop to make a column shape silicon single crystal grow. With this constitution, a necessary area can be significantly reduced and an integration density can be improved.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>1986</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19861115&amp;DB=EPODOC&amp;CC=JP&amp;NR=S61258467A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19861115&amp;DB=EPODOC&amp;CC=JP&amp;NR=S61258467A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOSHIHIRO NAOJI</creatorcontrib><creatorcontrib>NISHINO YOICHI</creatorcontrib><title>SEMICONDUCTOR MEMORY DEVICE</title><description>PURPOSE:To reduce a necessary area and improve a reliability by a method wherein an insulation film and a conductive film are laminated on the surface of a column shape part to form a capacitance part. CONSTITUTION:Gold is implanted into the position in a silicon substrate where a column shape part is to be formed by a converged ion beam method. The size of a gold-silicon alloy region can be controlled so as to have a diameter within a region about 0.2-10mum by regulating the diameter and the intensity of the ion beam. If the substrate is heated to the temperature not less than 370 deg.C, which is the eutectic temperature of gold-silicon alloy, in a cylinder type reaction furnace, a gold-silicon eutectic alloy liquid drop is formed at the position where the gold is implanted. If the substrate is placed in the reaction furnace whose inside temperature is maintained at 375 deg.C and SiCl4/H2 system mixture gas is introduced and made to react by a photoexcitation method, supersaturated silicon is deposited from the alloy liquid drop to make a column shape silicon single crystal grow. With this constitution, a necessary area can be significantly reduced and an integration density can be improved.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1986</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAOdvX1dPb3cwl1DvEPUvB19fUPilRwcQ3zdHblYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZoZGphYmZuaOxsSoAQBt3CEQ</recordid><startdate>19861115</startdate><enddate>19861115</enddate><creator>YOSHIHIRO NAOJI</creator><creator>NISHINO YOICHI</creator><scope>EVB</scope></search><sort><creationdate>19861115</creationdate><title>SEMICONDUCTOR MEMORY DEVICE</title><author>YOSHIHIRO NAOJI ; NISHINO YOICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS61258467A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1986</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>YOSHIHIRO NAOJI</creatorcontrib><creatorcontrib>NISHINO YOICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOSHIHIRO NAOJI</au><au>NISHINO YOICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR MEMORY DEVICE</title><date>1986-11-15</date><risdate>1986</risdate><abstract>PURPOSE:To reduce a necessary area and improve a reliability by a method wherein an insulation film and a conductive film are laminated on the surface of a column shape part to form a capacitance part. CONSTITUTION:Gold is implanted into the position in a silicon substrate where a column shape part is to be formed by a converged ion beam method. The size of a gold-silicon alloy region can be controlled so as to have a diameter within a region about 0.2-10mum by regulating the diameter and the intensity of the ion beam. If the substrate is heated to the temperature not less than 370 deg.C, which is the eutectic temperature of gold-silicon alloy, in a cylinder type reaction furnace, a gold-silicon eutectic alloy liquid drop is formed at the position where the gold is implanted. If the substrate is placed in the reaction furnace whose inside temperature is maintained at 375 deg.C and SiCl4/H2 system mixture gas is introduced and made to react by a photoexcitation method, supersaturated silicon is deposited from the alloy liquid drop to make a column shape silicon single crystal grow. With this constitution, a necessary area can be significantly reduced and an integration density can be improved.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPS61258467A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title SEMICONDUCTOR MEMORY DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T11%3A33%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOSHIHIRO%20NAOJI&rft.date=1986-11-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS61258467A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true