TERMINAL EQUIPMENT TESTING SYSTEM

PURPOSE:To obtain an economical terminal equipment testing device which does not obstruct the communication of other terminal equipment by providing on a switchboard a signal processing means for transferring the receiving information to a testing means, in case when the receiving information contai...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ABE MINORU, FURUHASHI TORU, KISHINO NORIAKI
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PURPOSE:To obtain an economical terminal equipment testing device which does not obstruct the communication of other terminal equipment by providing on a switchboard a signal processing means for transferring the receiving information to a testing means, in case when the receiving information contains test display information, and transmitting the information from the testing means, to the terminal equipment. CONSTITUTION:When a terminal equipment 2 gives a test instruction and executes a call, calling information containing a test display is sent out to an intra-office circuit terminating equipment 7 of a switchboard 6 from the terminal equipment 2 by a customer bus 3, a customer circuit terminating equipment 4, and a signal channel of a subscriber's line. The intra-office circuit terminating module 7 separates a signal on a multiplexed transmission common signal link 10b into the subscriber's line concerned 5, and sends it out to the terminal equipment 2 by a signal channel of the customer circuit terminating equipment 4 and the customer bus 3, by which calling confirming information which has been sent out of a test module 15 of the switchboard 6 reaches the terminal equipment 2 of the test calling. In accordance with this procedure, information is transmitted and received between the test terminal equipment 2 and the test module 15 of the switchboard 6. In this way, the terminal equipment can be tested without connecting a testing device to the terminal equipment, the test time can be shortened, and also the burden of a tester can be reduced.