APPARATUS FOR INSPECTING SURFACE CONTAMINATION
PURPOSE:To make it possible to perform the collection of a specimen from the surface of an object to be inspected and the measurement of a radioactive contamination degree by remote operation or automatic operation, by mounting a positioning apparatus, an examination paper supply apparatus, a radiat...
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creator | NISHIKAWA YOSHIHISA OOHASHI OSAMU KOGA AKIHIKO MISHIMA TAKEKATSU KIMURA AKIHIKO TOMITA FUMIAKI |
description | PURPOSE:To make it possible to perform the collection of a specimen from the surface of an object to be inspected and the measurement of a radioactive contamination degree by remote operation or automatic operation, by mounting a positioning apparatus, an examination paper supply apparatus, a radiation measuring apparatus and a manipulator. CONSTITUTION:The titled inspection apparatus is equipped with a positioning apparatus 11 for supporting a drum 10, a filter paper supply apparatus 13, a radiation measuring apparatus 14 for measuring the radioactive contamination degree of filter paper, a triaxial manipulator 17 having a boom 16 and a specimen collection head 18. The filter paper is picked up from the apparatus 13 by the head 18 and fed to the apparatus 11 by the manipulator 17 to be pressed to the inspection place of the surface of the drum 10. Next, the filter paper having a radioactive substance adhered thereto is fed and delivered to the apparatus 14 by the manipulator 17. Subsequently, the quantity of the adhered radioactive substance is measured by the apparatus 14. A series of these operations are automatically performed by the sequence control built in a microcomputer. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS6113171A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS6113171A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS6113171A3</originalsourceid><addsrcrecordid>eNrjZNBzDAhwDHIMCQ1WcPMPUvD0Cw5wdQ7x9HNXCA4NcnN0dlVw9vcLcfT19HMM8fT342FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8V4BwWaGhsaG5oaOxkQoAQC-hSXc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR INSPECTING SURFACE CONTAMINATION</title><source>esp@cenet</source><creator>NISHIKAWA YOSHIHISA ; OOHASHI OSAMU ; KOGA AKIHIKO ; MISHIMA TAKEKATSU ; KIMURA AKIHIKO ; TOMITA FUMIAKI</creator><creatorcontrib>NISHIKAWA YOSHIHISA ; OOHASHI OSAMU ; KOGA AKIHIKO ; MISHIMA TAKEKATSU ; KIMURA AKIHIKO ; TOMITA FUMIAKI</creatorcontrib><description>PURPOSE:To make it possible to perform the collection of a specimen from the surface of an object to be inspected and the measurement of a radioactive contamination degree by remote operation or automatic operation, by mounting a positioning apparatus, an examination paper supply apparatus, a radiation measuring apparatus and a manipulator. CONSTITUTION:The titled inspection apparatus is equipped with a positioning apparatus 11 for supporting a drum 10, a filter paper supply apparatus 13, a radiation measuring apparatus 14 for measuring the radioactive contamination degree of filter paper, a triaxial manipulator 17 having a boom 16 and a specimen collection head 18. The filter paper is picked up from the apparatus 13 by the head 18 and fed to the apparatus 11 by the manipulator 17 to be pressed to the inspection place of the surface of the drum 10. Next, the filter paper having a radioactive substance adhered thereto is fed and delivered to the apparatus 14 by the manipulator 17. Subsequently, the quantity of the adhered radioactive substance is measured by the apparatus 14. A series of these operations are automatically performed by the sequence control built in a microcomputer.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1986</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860121&DB=EPODOC&CC=JP&NR=S6113171A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860121&DB=EPODOC&CC=JP&NR=S6113171A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHIKAWA YOSHIHISA</creatorcontrib><creatorcontrib>OOHASHI OSAMU</creatorcontrib><creatorcontrib>KOGA AKIHIKO</creatorcontrib><creatorcontrib>MISHIMA TAKEKATSU</creatorcontrib><creatorcontrib>KIMURA AKIHIKO</creatorcontrib><creatorcontrib>TOMITA FUMIAKI</creatorcontrib><title>APPARATUS FOR INSPECTING SURFACE CONTAMINATION</title><description>PURPOSE:To make it possible to perform the collection of a specimen from the surface of an object to be inspected and the measurement of a radioactive contamination degree by remote operation or automatic operation, by mounting a positioning apparatus, an examination paper supply apparatus, a radiation measuring apparatus and a manipulator. CONSTITUTION:The titled inspection apparatus is equipped with a positioning apparatus 11 for supporting a drum 10, a filter paper supply apparatus 13, a radiation measuring apparatus 14 for measuring the radioactive contamination degree of filter paper, a triaxial manipulator 17 having a boom 16 and a specimen collection head 18. The filter paper is picked up from the apparatus 13 by the head 18 and fed to the apparatus 11 by the manipulator 17 to be pressed to the inspection place of the surface of the drum 10. Next, the filter paper having a radioactive substance adhered thereto is fed and delivered to the apparatus 14 by the manipulator 17. Subsequently, the quantity of the adhered radioactive substance is measured by the apparatus 14. A series of these operations are automatically performed by the sequence control built in a microcomputer.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1986</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBzDAhwDHIMCQ1WcPMPUvD0Cw5wdQ7x9HNXCA4NcnN0dlVw9vcLcfT19HMM8fT342FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8V4BwWaGhsaG5oaOxkQoAQC-hSXc</recordid><startdate>19860121</startdate><enddate>19860121</enddate><creator>NISHIKAWA YOSHIHISA</creator><creator>OOHASHI OSAMU</creator><creator>KOGA AKIHIKO</creator><creator>MISHIMA TAKEKATSU</creator><creator>KIMURA AKIHIKO</creator><creator>TOMITA FUMIAKI</creator><scope>EVB</scope></search><sort><creationdate>19860121</creationdate><title>APPARATUS FOR INSPECTING SURFACE CONTAMINATION</title><author>NISHIKAWA YOSHIHISA ; OOHASHI OSAMU ; KOGA AKIHIKO ; MISHIMA TAKEKATSU ; KIMURA AKIHIKO ; TOMITA FUMIAKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS6113171A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1986</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHIKAWA YOSHIHISA</creatorcontrib><creatorcontrib>OOHASHI OSAMU</creatorcontrib><creatorcontrib>KOGA AKIHIKO</creatorcontrib><creatorcontrib>MISHIMA TAKEKATSU</creatorcontrib><creatorcontrib>KIMURA AKIHIKO</creatorcontrib><creatorcontrib>TOMITA FUMIAKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHIKAWA YOSHIHISA</au><au>OOHASHI OSAMU</au><au>KOGA AKIHIKO</au><au>MISHIMA TAKEKATSU</au><au>KIMURA AKIHIKO</au><au>TOMITA FUMIAKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR INSPECTING SURFACE CONTAMINATION</title><date>1986-01-21</date><risdate>1986</risdate><abstract>PURPOSE:To make it possible to perform the collection of a specimen from the surface of an object to be inspected and the measurement of a radioactive contamination degree by remote operation or automatic operation, by mounting a positioning apparatus, an examination paper supply apparatus, a radiation measuring apparatus and a manipulator. CONSTITUTION:The titled inspection apparatus is equipped with a positioning apparatus 11 for supporting a drum 10, a filter paper supply apparatus 13, a radiation measuring apparatus 14 for measuring the radioactive contamination degree of filter paper, a triaxial manipulator 17 having a boom 16 and a specimen collection head 18. The filter paper is picked up from the apparatus 13 by the head 18 and fed to the apparatus 11 by the manipulator 17 to be pressed to the inspection place of the surface of the drum 10. Next, the filter paper having a radioactive substance adhered thereto is fed and delivered to the apparatus 14 by the manipulator 17. Subsequently, the quantity of the adhered radioactive substance is measured by the apparatus 14. A series of these operations are automatically performed by the sequence control built in a microcomputer.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING |
title | APPARATUS FOR INSPECTING SURFACE CONTAMINATION |
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