PROBE GUARD MOUNTING APPARATUS

PURPOSE:To facilitate the positioning of a probe guard, by fitting a reference pin of a support frame into a reference pin insertion hole of a guard body mounting plate. CONSTITUTION:To remove a probe guard 1 from a support frame 10, which is moved to the position off a scan optical system unit and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ISHIMOTO KAZUMI, ICHITENMANYA EIJI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ISHIMOTO KAZUMI
ICHITENMANYA EIJI
description PURPOSE:To facilitate the positioning of a probe guard, by fitting a reference pin of a support frame into a reference pin insertion hole of a guard body mounting plate. CONSTITUTION:To remove a probe guard 1 from a support frame 10, which is moved to the position off a scan optical system unit and after a nut 12 is loosened and removed, the support frame is lifted with a handle 8. In the mounting of the probe guard 1, a reference pin 11 of the support frame 10 is fitted into a reference pin insertion hole 7 of a guard body mounting plate 2, the plate 2 is placed on the support frame 10 and the nut 12 is screwed down with the reference pin 11. In this manner, the fitting of the reference pin 11 into the reference pin insertion hole 7 permits the position of the probe 17 to be determined accurately with respect to the measuring location of an electronic circuit thereby enabling quick and simple exchange of the probe guard 1.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS61120977A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS61120977A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS61120977A3</originalsourceid><addsrcrecordid>eNrjZJALCPJ3clVwD3UMclHw9Q_1C_H0c1dwDAhwDHIMCQ3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZoaGRgaW5uaOxsSoAQDGBSHM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROBE GUARD MOUNTING APPARATUS</title><source>esp@cenet</source><creator>ISHIMOTO KAZUMI ; ICHITENMANYA EIJI</creator><creatorcontrib>ISHIMOTO KAZUMI ; ICHITENMANYA EIJI</creatorcontrib><description>PURPOSE:To facilitate the positioning of a probe guard, by fitting a reference pin of a support frame into a reference pin insertion hole of a guard body mounting plate. CONSTITUTION:To remove a probe guard 1 from a support frame 10, which is moved to the position off a scan optical system unit and after a nut 12 is loosened and removed, the support frame is lifted with a handle 8. In the mounting of the probe guard 1, a reference pin 11 of the support frame 10 is fitted into a reference pin insertion hole 7 of a guard body mounting plate 2, the plate 2 is placed on the support frame 10 and the nut 12 is screwed down with the reference pin 11. In this manner, the fitting of the reference pin 11 into the reference pin insertion hole 7 permits the position of the probe 17 to be determined accurately with respect to the measuring location of an electronic circuit thereby enabling quick and simple exchange of the probe guard 1.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; RESISTORS ; TESTING</subject><creationdate>1986</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19860609&amp;DB=EPODOC&amp;CC=JP&amp;NR=S61120977A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19860609&amp;DB=EPODOC&amp;CC=JP&amp;NR=S61120977A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ISHIMOTO KAZUMI</creatorcontrib><creatorcontrib>ICHITENMANYA EIJI</creatorcontrib><title>PROBE GUARD MOUNTING APPARATUS</title><description>PURPOSE:To facilitate the positioning of a probe guard, by fitting a reference pin of a support frame into a reference pin insertion hole of a guard body mounting plate. CONSTITUTION:To remove a probe guard 1 from a support frame 10, which is moved to the position off a scan optical system unit and after a nut 12 is loosened and removed, the support frame is lifted with a handle 8. In the mounting of the probe guard 1, a reference pin 11 of the support frame 10 is fitted into a reference pin insertion hole 7 of a guard body mounting plate 2, the plate 2 is placed on the support frame 10 and the nut 12 is screwed down with the reference pin 11. In this manner, the fitting of the reference pin 11 into the reference pin insertion hole 7 permits the position of the probe 17 to be determined accurately with respect to the measuring location of an electronic circuit thereby enabling quick and simple exchange of the probe guard 1.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>RESISTORS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1986</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJALCPJ3clVwD3UMclHw9Q_1C_H0c1dwDAhwDHIMCQ3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZoaGRgaW5uaOxsSoAQDGBSHM</recordid><startdate>19860609</startdate><enddate>19860609</enddate><creator>ISHIMOTO KAZUMI</creator><creator>ICHITENMANYA EIJI</creator><scope>EVB</scope></search><sort><creationdate>19860609</creationdate><title>PROBE GUARD MOUNTING APPARATUS</title><author>ISHIMOTO KAZUMI ; ICHITENMANYA EIJI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS61120977A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1986</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>RESISTORS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ISHIMOTO KAZUMI</creatorcontrib><creatorcontrib>ICHITENMANYA EIJI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ISHIMOTO KAZUMI</au><au>ICHITENMANYA EIJI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROBE GUARD MOUNTING APPARATUS</title><date>1986-06-09</date><risdate>1986</risdate><abstract>PURPOSE:To facilitate the positioning of a probe guard, by fitting a reference pin of a support frame into a reference pin insertion hole of a guard body mounting plate. CONSTITUTION:To remove a probe guard 1 from a support frame 10, which is moved to the position off a scan optical system unit and after a nut 12 is loosened and removed, the support frame is lifted with a handle 8. In the mounting of the probe guard 1, a reference pin 11 of the support frame 10 is fitted into a reference pin insertion hole 7 of a guard body mounting plate 2, the plate 2 is placed on the support frame 10 and the nut 12 is screwed down with the reference pin 11. In this manner, the fitting of the reference pin 11 into the reference pin insertion hole 7 permits the position of the probe 17 to be determined accurately with respect to the measuring location of an electronic circuit thereby enabling quick and simple exchange of the probe guard 1.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPS61120977A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
RESISTORS
TESTING
title PROBE GUARD MOUNTING APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T16%3A40%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ISHIMOTO%20KAZUMI&rft.date=1986-06-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS61120977A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true