LEVEL UTILIZING SEMICONDUCTOR SENSOR

PURPOSE:To measure levelness with high precision by arranging an optoelec tromotive force type semiconductor sensor in a case provided with a slit which stops down irradiation light at the upper part. CONSTITUTION:The level 1 is provided with the case 2, the slit 3 at the upper part of the case, and...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SAITO TOMOYUKI, ISHIBE MASAHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	GYROSCOPIC INSTRUMENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING
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