DIAGNOZING METHOD OF VOID DEFECT OF ELECTRIC APPARATUS ON THE BASIS OF PARTIAL DISCHARGING PHASE CHARACTERISTICS

PURPOSE:To diagnoze rapidly and precisely the kind of a void defect and its generating position by finding out the partial discharging phase characteristics of a partial discharging pulse to applied voltage and detecting similarity of the found partial discharging phase characteristics to previously...

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Bibliographische Detailangaben
Hauptverfasser: TANAKA TOSHIKATSU, OKAMOTO TATSUKI, FUKAGAWA HIROMASA
Format: Patent
Sprache:eng
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