SAMPLE-AND-HOLD CIRCUIT

SAMPLE-AND-HOLD CIRCUIT

PURPOSE:To use stably the circuit even at a low voltage by driving a differential switch with a current mirror circuit. CONSTITUTION:A differential switch comprising transistors (TRs) Q6, Q7 is driven by the current mirror circuit consisting of TRs Q14, Q15. A current supplied from a TRQ11 flows to...

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1. Verfasser: KATOU KIKUO
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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creator KATOU KIKUO
description PURPOSE:To use stably the circuit even at a low voltage by driving a differential switch with a current mirror circuit. CONSTITUTION:A differential switch comprising transistors (TRs) Q6, Q7 is driven by the current mirror circuit consisting of TRs Q14, Q15. A current supplied from a TRQ11 flows to the TRQ14 and a resistor R13 by the operation of a comparator 6 during the sample period. A TRQ7 is turned on, a TRQ6 is turned off, a current I1 in response to the resistance ratio of the resistors R13, R6 flows to the TRQ7, the charge/discharge current required for the sample period and a current flowing to the TRQ6 at hold period are set freely by selecting optionally the ratio of the resistors R6 and R13 and the ratio of the resistors R6 and R14, thereby eliminating the saturation of the TRs Q2, Q6 and the limitation of the amplifier gain setting resistor R1. A bias voltage source for differential switch drive is not required.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS60119700A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS60119700A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS60119700A3</originalsourceid><addsrcrecordid>eNrjZBAPdvQN8HHVdfRz0fXw93FRcPYMcg71DOFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAcFmBoaGluYGBo7GxKgBAM5dH48</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SAMPLE-AND-HOLD CIRCUIT</title><source>esp@cenet</source><creator>KATOU KIKUO</creator><creatorcontrib>KATOU KIKUO</creatorcontrib><description>PURPOSE:To use stably the circuit even at a low voltage by driving a differential switch with a current mirror circuit. CONSTITUTION:A differential switch comprising transistors (TRs) Q6, Q7 is driven by the current mirror circuit consisting of TRs Q14, Q15. A current supplied from a TRQ11 flows to the TRQ14 and a resistor R13 by the operation of a comparator 6 during the sample period. A TRQ7 is turned on, a TRQ6 is turned off, a current I1 in response to the resistance ratio of the resistors R13, R6 flows to the TRQ7, the charge/discharge current required for the sample period and a current flowing to the TRQ6 at hold period are set freely by selecting optionally the ratio of the resistors R6 and R13 and the ratio of the resistors R6 and R14, thereby eliminating the saturation of the TRs Q2, Q6 and the limitation of the amplifier gain setting resistor R1. A bias voltage source for differential switch drive is not required.</description><edition>4</edition><language>eng</language><subject>INFORMATION STORAGE ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; STATIC STORES ; TESTING</subject><creationdate>1985</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19850627&amp;DB=EPODOC&amp;CC=JP&amp;NR=S60119700A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19850627&amp;DB=EPODOC&amp;CC=JP&amp;NR=S60119700A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KATOU KIKUO</creatorcontrib><title>SAMPLE-AND-HOLD CIRCUIT</title><description>PURPOSE:To use stably the circuit even at a low voltage by driving a differential switch with a current mirror circuit. CONSTITUTION:A differential switch comprising transistors (TRs) Q6, Q7 is driven by the current mirror circuit consisting of TRs Q14, Q15. A current supplied from a TRQ11 flows to the TRQ14 and a resistor R13 by the operation of a comparator 6 during the sample period. A TRQ7 is turned on, a TRQ6 is turned off, a current I1 in response to the resistance ratio of the resistors R13, R6 flows to the TRQ7, the charge/discharge current required for the sample period and a current flowing to the TRQ6 at hold period are set freely by selecting optionally the ratio of the resistors R6 and R13 and the ratio of the resistors R6 and R14, thereby eliminating the saturation of the TRs Q2, Q6 and the limitation of the amplifier gain setting resistor R1. A bias voltage source for differential switch drive is not required.</description><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1985</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAPdvQN8HHVdfRz0fXw93FRcPYMcg71DOFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAcFmBoaGluYGBo7GxKgBAM5dH48</recordid><startdate>19850627</startdate><enddate>19850627</enddate><creator>KATOU KIKUO</creator><scope>EVB</scope></search><sort><creationdate>19850627</creationdate><title>SAMPLE-AND-HOLD CIRCUIT</title><author>KATOU KIKUO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS60119700A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1985</creationdate><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KATOU KIKUO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KATOU KIKUO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SAMPLE-AND-HOLD CIRCUIT</title><date>1985-06-27</date><risdate>1985</risdate><abstract>PURPOSE:To use stably the circuit even at a low voltage by driving a differential switch with a current mirror circuit. CONSTITUTION:A differential switch comprising transistors (TRs) Q6, Q7 is driven by the current mirror circuit consisting of TRs Q14, Q15. A current supplied from a TRQ11 flows to the TRQ14 and a resistor R13 by the operation of a comparator 6 during the sample period. A TRQ7 is turned on, a TRQ6 is turned off, a current I1 in response to the resistance ratio of the resistors R13, R6 flows to the TRQ7, the charge/discharge current required for the sample period and a current flowing to the TRQ6 at hold period are set freely by selecting optionally the ratio of the resistors R6 and R13 and the ratio of the resistors R6 and R14, thereby eliminating the saturation of the TRs Q2, Q6 and the limitation of the amplifier gain setting resistor R1. A bias voltage source for differential switch drive is not required.</abstract><edition>4</edition><oa>free_for_read</oa></addata></record>
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subjects INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
title SAMPLE-AND-HOLD CIRCUIT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T00%3A51%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KATOU%20KIKUO&rft.date=1985-06-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS60119700A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true