FIXED SLIT TYPE PHOTOELECTRIC MICROSCOPE
PURPOSE:To facilitate adjustment by providing a fixedly arranged couple of slits, a couple of polarizers which have polarization directions crossing with each other at right angles, and a mechanism which generates a couple of light beams alternately at a specific periods as a modulating means of lum...
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| creator | SHINOZAKI TOSHIAKI MORI ICHIROU |
| description | PURPOSE:To facilitate adjustment by providing a fixedly arranged couple of slits, a couple of polarizers which have polarization directions crossing with each other at right angles, and a mechanism which generates a couple of light beams alternately at a specific periods as a modulating means of luminous flux incident to a photoelectric transducer. CONSTITUTION:Luminous flux from a scale line 42 on a scale 41 is incident to the photoelectric transducer 58 through slits 54a and 54b of a slit plate 54 alternately by the irradiation with alternate polarized light beams P' and Q' from a light irradiating mechanism which are polarized linearly at right angles to each other and the operation of the slits 54a and 54b of the slit plate 54 and polarizing plates 56a and 56b. This when viewed from the side of the photoelectric transducer 58 is equivalent to the effect when one slit is oscillated mechanically corresponding to a detection origin and the displacement of the scale line 42 on the scale is therefore detected. |
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CONSTITUTION:Luminous flux from a scale line 42 on a scale 41 is incident to the photoelectric transducer 58 through slits 54a and 54b of a slit plate 54 alternately by the irradiation with alternate polarized light beams P' and Q' from a light irradiating mechanism which are polarized linearly at right angles to each other and the operation of the slits 54a and 54b of the slit plate 54 and polarizing plates 56a and 56b. This when viewed from the side of the photoelectric transducer 58 is equivalent to the effect when one slit is oscillated mechanically corresponding to a detection origin and the displacement of the scale line 42 on the scale is therefore detected.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FREQUENCY-CHANGING ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><creationdate>1984</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840228&DB=EPODOC&CC=JP&NR=S5936219A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840228&DB=EPODOC&CC=JP&NR=S5936219A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHINOZAKI TOSHIAKI</creatorcontrib><creatorcontrib>MORI ICHIROU</creatorcontrib><title>FIXED SLIT TYPE PHOTOELECTRIC MICROSCOPE</title><description>PURPOSE:To facilitate adjustment by providing a fixedly arranged couple of slits, a couple of polarizers which have polarization directions crossing with each other at right angles, and a mechanism which generates a couple of light beams alternately at a specific periods as a modulating means of luminous flux incident to a photoelectric transducer. CONSTITUTION:Luminous flux from a scale line 42 on a scale 41 is incident to the photoelectric transducer 58 through slits 54a and 54b of a slit plate 54 alternately by the irradiation with alternate polarized light beams P' and Q' from a light irradiating mechanism which are polarized linearly at right angles to each other and the operation of the slits 54a and 54b of the slit plate 54 and polarizing plates 56a and 56b. This when viewed from the side of the photoelectric transducer 58 is equivalent to the effect when one slit is oscillated mechanically corresponding to a detection origin and the displacement of the scale line 42 on the scale is therefore detected.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FREQUENCY-CHANGING</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1984</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBw84xwdVEI9vEMUQiJDHBVCPDwD_F39XF1DgnydFbw9XQO8g929g9w5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8V4BwaaWxmZGhpaOxkQoAQDgZyRC</recordid><startdate>19840228</startdate><enddate>19840228</enddate><creator>SHINOZAKI TOSHIAKI</creator><creator>MORI ICHIROU</creator><scope>EVB</scope></search><sort><creationdate>19840228</creationdate><title>FIXED SLIT TYPE PHOTOELECTRIC MICROSCOPE</title><author>SHINOZAKI TOSHIAKI ; MORI ICHIROU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS5936219A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1984</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FREQUENCY-CHANGING</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><toplevel>online_resources</toplevel><creatorcontrib>SHINOZAKI TOSHIAKI</creatorcontrib><creatorcontrib>MORI ICHIROU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHINOZAKI TOSHIAKI</au><au>MORI ICHIROU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FIXED SLIT TYPE PHOTOELECTRIC MICROSCOPE</title><date>1984-02-28</date><risdate>1984</risdate><abstract>PURPOSE:To facilitate adjustment by providing a fixedly arranged couple of slits, a couple of polarizers which have polarization directions crossing with each other at right angles, and a mechanism which generates a couple of light beams alternately at a specific periods as a modulating means of luminous flux incident to a photoelectric transducer. CONSTITUTION:Luminous flux from a scale line 42 on a scale 41 is incident to the photoelectric transducer 58 through slits 54a and 54b of a slit plate 54 alternately by the irradiation with alternate polarized light beams P' and Q' from a light irradiating mechanism which are polarized linearly at right angles to each other and the operation of the slits 54a and 54b of the slit plate 54 and polarizing plates 56a and 56b. This when viewed from the side of the photoelectric transducer 58 is equivalent to the effect when one slit is oscillated mechanically corresponding to a detection origin and the displacement of the scale line 42 on the scale is therefore detected.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEMICONDUCTOR DEVICES TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF |
| title | FIXED SLIT TYPE PHOTOELECTRIC MICROSCOPE |
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