METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR
PURPOSE:To discriminate the quantity of residual water in a dielectric layer of a capacitor by measuring dielectric loss at a temperature close to 100 deg.C. CONSTITUTION:When the dielectric layer is heated up to a temperature close to 100 deg.C, i.e. the boiling point of water, the loss of the diel...
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| creator | FUJIWARA KAZUO OOMAE KOUICHI |
| description | PURPOSE:To discriminate the quantity of residual water in a dielectric layer of a capacitor by measuring dielectric loss at a temperature close to 100 deg.C. CONSTITUTION:When the dielectric layer is heated up to a temperature close to 100 deg.C, i.e. the boiling point of water, the loss of the dielectric layer having much residual water is extremely increased. It is supposed that the phenomenon takes place because the molecular motion of water increased when the electric layer is heated up to about 100 deg.C. Insulating constitution of samples A, B, C consists of a capacitor arranging 18mu insulating paper and a 36mu plastic film between electrode foils. Consequently, the dried degree of a production process or water absorption in a long usage can be decided. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS59200952A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS59200952A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS59200952A3</originalsourceid><addsrcrecordid>eNrjZHDxdQ3x8HdRcPMPUvB1dQwODfL0c1cIcg32dAl19FEIdwxxDVLw9FNw8XT1cXUOCfJ0VvBxjASK-bspODsGODp7hvgH8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeK-AYFNLIwMDS1MjR2Ni1AAATdAr6Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR</title><source>esp@cenet</source><creator>FUJIWARA KAZUO ; OOMAE KOUICHI</creator><creatorcontrib>FUJIWARA KAZUO ; OOMAE KOUICHI</creatorcontrib><description>PURPOSE:To discriminate the quantity of residual water in a dielectric layer of a capacitor by measuring dielectric loss at a temperature close to 100 deg.C. CONSTITUTION:When the dielectric layer is heated up to a temperature close to 100 deg.C, i.e. the boiling point of water, the loss of the dielectric layer having much residual water is extremely increased. It is supposed that the phenomenon takes place because the molecular motion of water increased when the electric layer is heated up to about 100 deg.C. Insulating constitution of samples A, B, C consists of a capacitor arranging 18mu insulating paper and a 36mu plastic film between electrode foils. Consequently, the dried degree of a production process or water absorption in a long usage can be decided.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CAPACITORS ; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1984</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19841114&DB=EPODOC&CC=JP&NR=S59200952A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19841114&DB=EPODOC&CC=JP&NR=S59200952A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUJIWARA KAZUO</creatorcontrib><creatorcontrib>OOMAE KOUICHI</creatorcontrib><title>METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR</title><description>PURPOSE:To discriminate the quantity of residual water in a dielectric layer of a capacitor by measuring dielectric loss at a temperature close to 100 deg.C. CONSTITUTION:When the dielectric layer is heated up to a temperature close to 100 deg.C, i.e. the boiling point of water, the loss of the dielectric layer having much residual water is extremely increased. It is supposed that the phenomenon takes place because the molecular motion of water increased when the electric layer is heated up to about 100 deg.C. Insulating constitution of samples A, B, C consists of a capacitor arranging 18mu insulating paper and a 36mu plastic film between electrode foils. Consequently, the dried degree of a production process or water absorption in a long usage can be decided.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CAPACITORS</subject><subject>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1984</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxdQ3x8HdRcPMPUvB1dQwODfL0c1cIcg32dAl19FEIdwxxDVLw9FNw8XT1cXUOCfJ0VvBxjASK-bspODsGODp7hvgH8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeK-AYFNLIwMDS1MjR2Ni1AAATdAr6Q</recordid><startdate>19841114</startdate><enddate>19841114</enddate><creator>FUJIWARA KAZUO</creator><creator>OOMAE KOUICHI</creator><scope>EVB</scope></search><sort><creationdate>19841114</creationdate><title>METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR</title><author>FUJIWARA KAZUO ; OOMAE KOUICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS59200952A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1984</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CAPACITORS</topic><topic>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FUJIWARA KAZUO</creatorcontrib><creatorcontrib>OOMAE KOUICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUJIWARA KAZUO</au><au>OOMAE KOUICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR</title><date>1984-11-14</date><risdate>1984</risdate><abstract>PURPOSE:To discriminate the quantity of residual water in a dielectric layer of a capacitor by measuring dielectric loss at a temperature close to 100 deg.C. CONSTITUTION:When the dielectric layer is heated up to a temperature close to 100 deg.C, i.e. the boiling point of water, the loss of the dielectric layer having much residual water is extremely increased. It is supposed that the phenomenon takes place because the molecular motion of water increased when the electric layer is heated up to about 100 deg.C. Insulating constitution of samples A, B, C consists of a capacitor arranging 18mu insulating paper and a 36mu plastic film between electrode foils. Consequently, the dried degree of a production process or water absorption in a long usage can be decided.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS CAPACITORS CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | METHOD FOR MEASURING RESIDUAL WATER IN DIELECTRIC LAYER OF CAPACITOR |
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