LOGICAL CIRCUIT

PURPOSE:To perform the diagnosis of a logical circuit with no big increment of the number of input/output pin by using the counter logic for address control to perform the test of a memory part. CONSTITUTION:In a normal working mode, only a counter 1 is used, and the state information of a computer...

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Hauptverfasser:	OOBA TAKAO, IGARASHI TOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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creator	OOBA TAKAO IGARASHI TOSHIO
description	PURPOSE:To perform the diagnosis of a logical circuit with no big increment of the number of input/output pin by using the counter logic for address control to perform the test of a memory part. CONSTITUTION:In a normal working mode, only a counter 1 is used, and the state information of a computer fed to a data latch 5 is fetched successively to a memory 2 via a selector 9. A control part 4 controls the write/read action to extract successively the information out of the memory 2. While upper counters 6 and 7 for the diagnosis are actuated under the control of a diagnosis control part 13 in a diagnosis mode. Then a matching test is performed by means of an upper address. As a result, the number can be reduced for input/output pin used for the diagnosis of a memory element.
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CONSTITUTION:In a normal working mode, only a counter 1 is used, and the state information of a computer fed to a data latch 5 is fetched successively to a memory 2 via a selector 9. A control part 4 controls the write/read action to extract successively the information out of the memory 2. While upper counters 6 and 7 for the diagnosis are actuated under the control of a diagnosis control part 13 in a diagnosis mode. Then a matching test is performed by means of an upper address. As a result, the number can be reduced for input/output pin used for the diagnosis of a memory element.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; STATIC STORES ; TESTING</subject><creationdate>1984</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840824&DB=EPODOC&CC=JP&NR=S59148196A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840824&DB=EPODOC&CC=JP&NR=S59148196A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OOBA TAKAO</creatorcontrib><creatorcontrib>IGARASHI TOSHIO</creatorcontrib><title>LOGICAL CIRCUIT</title><description>PURPOSE:To perform the diagnosis of a logical circuit with no big increment of the number of input/output pin by using the counter logic for address control to perform the test of a memory part. 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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
title	LOGICAL CIRCUIT
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