ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS

PURPOSE:To atomize an analysis sample without the use of a combustible gas at all, by a method wherein air in an atmosphere pressure is brought into a plasma condition by means of a high frequency, and a brilliance-modulated light source is used. CONSTITUTION:An air plasma 4 is produced by a microwa...

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Hauptverfasser: KOIZUMI HIDEAKI, OOISHI KOUNOSUKE
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creator KOIZUMI HIDEAKI
OOISHI KOUNOSUKE
description PURPOSE:To atomize an analysis sample without the use of a combustible gas at all, by a method wherein air in an atmosphere pressure is brought into a plasma condition by means of a high frequency, and a brilliance-modulated light source is used. CONSTITUTION:An air plasma 4 is produced by a microwave generated by a magnetron 11. Air is fed by an air pump 14, and a solution sample 13, atomized by a atomizer 12, is mixed. The mixture is caused to flow so as to cover an electrode 9 to form the plasma. 4. A hollow cathode lamp 1 is lighted by a pulsating current of 1.5KHz, and a strength of radiant light is modulated to pass it through the plasma. Light, coming out from the plasma, selects an analysis ray by means of a spectroscope 5 to detect it by a photomultiplier 7. The detecting signal is amplified by a preamplifier 30, it passes through a band-pass filter 31 which passes only a full frequency component of 1.5kHz, and absorbance is displayed in a recorder 33 after passage of it through a logarithmic converter.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS5887446A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS5887446A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS5887446A3</originalsourceid><addsrcrecordid>eNrjZNB1DPH39Yzy9HNXcHEN83R2VXDzD1IACSo4OgX7Bzk5-gHFHP0cfSKDPYN5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8V0CwqYWFuYmJmaMxEUoAefwlbA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS</title><source>esp@cenet</source><creator>KOIZUMI HIDEAKI ; OOISHI KOUNOSUKE</creator><creatorcontrib>KOIZUMI HIDEAKI ; OOISHI KOUNOSUKE</creatorcontrib><description>PURPOSE:To atomize an analysis sample without the use of a combustible gas at all, by a method wherein air in an atmosphere pressure is brought into a plasma condition by means of a high frequency, and a brilliance-modulated light source is used. CONSTITUTION:An air plasma 4 is produced by a microwave generated by a magnetron 11. Air is fed by an air pump 14, and a solution sample 13, atomized by a atomizer 12, is mixed. The mixture is caused to flow so as to cover an electrode 9 to form the plasma. 4. A hollow cathode lamp 1 is lighted by a pulsating current of 1.5KHz, and a strength of radiant light is modulated to pass it through the plasma. Light, coming out from the plasma, selects an analysis ray by means of a spectroscope 5 to detect it by a photomultiplier 7. The detecting signal is amplified by a preamplifier 30, it passes through a band-pass filter 31 which passes only a full frequency component of 1.5kHz, and absorbance is displayed in a recorder 33 after passage of it through a logarithmic converter.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1983</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19830525&amp;DB=EPODOC&amp;CC=JP&amp;NR=S5887446A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19830525&amp;DB=EPODOC&amp;CC=JP&amp;NR=S5887446A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOIZUMI HIDEAKI</creatorcontrib><creatorcontrib>OOISHI KOUNOSUKE</creatorcontrib><title>ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS</title><description>PURPOSE:To atomize an analysis sample without the use of a combustible gas at all, by a method wherein air in an atmosphere pressure is brought into a plasma condition by means of a high frequency, and a brilliance-modulated light source is used. CONSTITUTION:An air plasma 4 is produced by a microwave generated by a magnetron 11. Air is fed by an air pump 14, and a solution sample 13, atomized by a atomizer 12, is mixed. The mixture is caused to flow so as to cover an electrode 9 to form the plasma. 4. A hollow cathode lamp 1 is lighted by a pulsating current of 1.5KHz, and a strength of radiant light is modulated to pass it through the plasma. Light, coming out from the plasma, selects an analysis ray by means of a spectroscope 5 to detect it by a photomultiplier 7. The detecting signal is amplified by a preamplifier 30, it passes through a band-pass filter 31 which passes only a full frequency component of 1.5kHz, and absorbance is displayed in a recorder 33 after passage of it through a logarithmic converter.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1983</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB1DPH39Yzy9HNXcHEN83R2VXDzD1IACSo4OgX7Bzk5-gHFHP0cfSKDPYN5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8V0CwqYWFuYmJmaMxEUoAefwlbA</recordid><startdate>19830525</startdate><enddate>19830525</enddate><creator>KOIZUMI HIDEAKI</creator><creator>OOISHI KOUNOSUKE</creator><scope>EVB</scope></search><sort><creationdate>19830525</creationdate><title>ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS</title><author>KOIZUMI HIDEAKI ; OOISHI KOUNOSUKE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS5887446A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1983</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOIZUMI HIDEAKI</creatorcontrib><creatorcontrib>OOISHI KOUNOSUKE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOIZUMI HIDEAKI</au><au>OOISHI KOUNOSUKE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS</title><date>1983-05-25</date><risdate>1983</risdate><abstract>PURPOSE:To atomize an analysis sample without the use of a combustible gas at all, by a method wherein air in an atmosphere pressure is brought into a plasma condition by means of a high frequency, and a brilliance-modulated light source is used. CONSTITUTION:An air plasma 4 is produced by a microwave generated by a magnetron 11. Air is fed by an air pump 14, and a solution sample 13, atomized by a atomizer 12, is mixed. The mixture is caused to flow so as to cover an electrode 9 to form the plasma. 4. A hollow cathode lamp 1 is lighted by a pulsating current of 1.5KHz, and a strength of radiant light is modulated to pass it through the plasma. Light, coming out from the plasma, selects an analysis ray by means of a spectroscope 5 to detect it by a photomultiplier 7. The detecting signal is amplified by a preamplifier 30, it passes through a band-pass filter 31 which passes only a full frequency component of 1.5kHz, and absorbance is displayed in a recorder 33 after passage of it through a logarithmic converter.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title ATOMIZING DEVICE FOR ATOM ABSORBANCE ANALYSIS
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