MEASURING SYSTEM OF REFLECTANCE OF LIGHT

MEASURING SYSTEM OF REFLECTANCE OF LIGHT

PURPOSE:To measure precisely the reflectance by measuring a light flux of single wavelength produced from a spectroscope as the output and transmitted through a beam splitter and a light flux bent by 90 degree, a light flux, etc. obtained by bending by 90 degree by a splitter the reflected light of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TAKAO NORIYASU
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator TAKAO NORIYASU
description PURPOSE:To measure precisely the reflectance by measuring a light flux of single wavelength produced from a spectroscope as the output and transmitted through a beam splitter and a light flux bent by 90 degree, a light flux, etc. obtained by bending by 90 degree by a splitter the reflected light of the sample on the light axis of the transmitted light flux. CONSTITUTION:The light flux of single wavelength light from the spectroscope 11 is measured by PM13 (PM is photomultiplier tube) and the value is defined as I1, and the values obtained by measuring the fluxes of the light transmitted through the beam splitter 21 and the light whose direction is bent by 90 degree are defined as I2, I3 respectively. A sample 31 to be measured is set on the axis of the light passed through the splitter 21, and the reflected light impinged at the sample 31 is furthermore bent by 90 degree by the splitter 21, and the light flux thereof is measured by PM13 and the value is defined as I4. Thus the reflectance R of the perpendicular incident light to the sample 31 is obtained from I1.I4/I2.I3 and the precise reflectance can be obtained.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS58195141A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS58195141A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS58195141A3</originalsourceid><addsrcrecordid>eNrjZNDwdXUMDg3y9HNXCI4MDnH1VfB3UwhydfNxdQ5x9HN2BXF9PN09QngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbxXQLCphaGlqaGJoaMxMWoADXUkWQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MEASURING SYSTEM OF REFLECTANCE OF LIGHT</title><source>esp@cenet</source><creator>TAKAO NORIYASU</creator><creatorcontrib>TAKAO NORIYASU</creatorcontrib><description>PURPOSE:To measure precisely the reflectance by measuring a light flux of single wavelength produced from a spectroscope as the output and transmitted through a beam splitter and a light flux bent by 90 degree, a light flux, etc. obtained by bending by 90 degree by a splitter the reflected light of the sample on the light axis of the transmitted light flux. CONSTITUTION:The light flux of single wavelength light from the spectroscope 11 is measured by PM13 (PM is photomultiplier tube) and the value is defined as I1, and the values obtained by measuring the fluxes of the light transmitted through the beam splitter 21 and the light whose direction is bent by 90 degree are defined as I2, I3 respectively. A sample 31 to be measured is set on the axis of the light passed through the splitter 21, and the reflected light impinged at the sample 31 is furthermore bent by 90 degree by the splitter 21, and the light flux thereof is measured by PM13 and the value is defined as I4. Thus the reflectance R of the perpendicular incident light to the sample 31 is obtained from I1.I4/I2.I3 and the precise reflectance can be obtained.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1983</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19831114&amp;DB=EPODOC&amp;CC=JP&amp;NR=S58195141A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19831114&amp;DB=EPODOC&amp;CC=JP&amp;NR=S58195141A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAKAO NORIYASU</creatorcontrib><title>MEASURING SYSTEM OF REFLECTANCE OF LIGHT</title><description>PURPOSE:To measure precisely the reflectance by measuring a light flux of single wavelength produced from a spectroscope as the output and transmitted through a beam splitter and a light flux bent by 90 degree, a light flux, etc. obtained by bending by 90 degree by a splitter the reflected light of the sample on the light axis of the transmitted light flux. CONSTITUTION:The light flux of single wavelength light from the spectroscope 11 is measured by PM13 (PM is photomultiplier tube) and the value is defined as I1, and the values obtained by measuring the fluxes of the light transmitted through the beam splitter 21 and the light whose direction is bent by 90 degree are defined as I2, I3 respectively. A sample 31 to be measured is set on the axis of the light passed through the splitter 21, and the reflected light impinged at the sample 31 is furthermore bent by 90 degree by the splitter 21, and the light flux thereof is measured by PM13 and the value is defined as I4. Thus the reflectance R of the perpendicular incident light to the sample 31 is obtained from I1.I4/I2.I3 and the precise reflectance can be obtained.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1983</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDwdXUMDg3y9HNXCI4MDnH1VfB3UwhydfNxdQ5x9HN2BXF9PN09QngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbxXQLCphaGlqaGJoaMxMWoADXUkWQ</recordid><startdate>19831114</startdate><enddate>19831114</enddate><creator>TAKAO NORIYASU</creator><scope>EVB</scope></search><sort><creationdate>19831114</creationdate><title>MEASURING SYSTEM OF REFLECTANCE OF LIGHT</title><author>TAKAO NORIYASU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS58195141A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1983</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAKAO NORIYASU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAKAO NORIYASU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING SYSTEM OF REFLECTANCE OF LIGHT</title><date>1983-11-14</date><risdate>1983</risdate><abstract>PURPOSE:To measure precisely the reflectance by measuring a light flux of single wavelength produced from a spectroscope as the output and transmitted through a beam splitter and a light flux bent by 90 degree, a light flux, etc. obtained by bending by 90 degree by a splitter the reflected light of the sample on the light axis of the transmitted light flux. CONSTITUTION:The light flux of single wavelength light from the spectroscope 11 is measured by PM13 (PM is photomultiplier tube) and the value is defined as I1, and the values obtained by measuring the fluxes of the light transmitted through the beam splitter 21 and the light whose direction is bent by 90 degree are defined as I2, I3 respectively. A sample 31 to be measured is set on the axis of the light passed through the splitter 21, and the reflected light impinged at the sample 31 is furthermore bent by 90 degree by the splitter 21, and the light flux thereof is measured by PM13 and the value is defined as I4. Thus the reflectance R of the perpendicular incident light to the sample 31 is obtained from I1.I4/I2.I3 and the precise reflectance can be obtained.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPS58195141A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title MEASURING SYSTEM OF REFLECTANCE OF LIGHT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T10%3A21%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TAKAO%20NORIYASU&rft.date=1983-11-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS58195141A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true