SAMPLE ANALYZING METHOD USING MICROANALYZER

PURPOSE:To know the distributing condition of a segregate in a sample accurately in a short time by making a surface analysis of the segregate along its extending direction with fluorescent X rays. CONSTITUTION:On the basis of data D1 obtained by extracting only information on a prescribed aimed ele...

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Bibliographische Detailangaben
1. Verfasser: SATOU MITSUYOSHI
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To know the distributing condition of a segregate in a sample accurately in a short time by making a surface analysis of the segregate along its extending direction with fluorescent X rays. CONSTITUTION:On the basis of data D1 obtained by extracting only information on a prescribed aimed elemnt in an input time-series signal by a crest analysis, a central processor 17 computes the distribution of the aimed element at the scanning part and also detects the position of a segregate zone in a sample on the basis of the arithmetic result to execute a prescribed program for deciding on which part on the analytic surface 2a of the sample piece 2 is to be positioned according to the segregating zone position information. In a next step, data D2 on the position to be scanned is inputted to an interface circuit 18 to move a moving table 3.