MASK STORAGE DEVICE

PROBLEM TO BE SOLVED: To decompose and remove defect causing materials sticking to a mask and to always ensure clean mask quality as well as to prevent the occurrence of defects on the mask during storage. SOLUTION: A wall 2 made of a photocatalytic material and an illumination light source 3 capabl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OKADA IKUO, MATSUDA KOREHITO, SEKIMOTO MISAO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator OKADA IKUO
MATSUDA KOREHITO
SEKIMOTO MISAO
description PROBLEM TO BE SOLVED: To decompose and remove defect causing materials sticking to a mask and to always ensure clean mask quality as well as to prevent the occurrence of defects on the mask during storage. SOLUTION: A wall 2 made of a photocatalytic material and an illumination light source 3 capable of exciting photocatalytic reaction are disposed in a housing vessel 1 for housing a mask 4. When the wall 2 is irradiated with UV from the light source 3, excited active oxygen radicals etc., are generated from the surface of the wall 2 and photocatalytic reaction accompanied by strong oxidation-reduction action is caused. By the reaction, gaseous impurities etc., existing in atmospheric gas 5, are converted into harmless inorg. ions after decomposition, e.g. into gaseous CO2 and H2 . Defect causing materials do not stick to the mask 4 and the occurrence of defects on the mask 4 can be prevented.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH1195413A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH1195413A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH1195413A3</originalsourceid><addsrcrecordid>eNrjZBD2dQz2VggO8Q9ydHdVcHEN83R25WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGlqYmhsaOxkQoAQAZyB37</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MASK STORAGE DEVICE</title><source>esp@cenet</source><creator>OKADA IKUO ; MATSUDA KOREHITO ; SEKIMOTO MISAO</creator><creatorcontrib>OKADA IKUO ; MATSUDA KOREHITO ; SEKIMOTO MISAO</creatorcontrib><description>PROBLEM TO BE SOLVED: To decompose and remove defect causing materials sticking to a mask and to always ensure clean mask quality as well as to prevent the occurrence of defects on the mask during storage. SOLUTION: A wall 2 made of a photocatalytic material and an illumination light source 3 capable of exciting photocatalytic reaction are disposed in a housing vessel 1 for housing a mask 4. When the wall 2 is irradiated with UV from the light source 3, excited active oxygen radicals etc., are generated from the surface of the wall 2 and photocatalytic reaction accompanied by strong oxidation-reduction action is caused. By the reaction, gaseous impurities etc., existing in atmospheric gas 5, are converted into harmless inorg. ions after decomposition, e.g. into gaseous CO2 and H2 . Defect causing materials do not stick to the mask 4 and the occurrence of defects on the mask 4 can be prevented.</description><edition>6</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19990409&amp;DB=EPODOC&amp;CC=JP&amp;NR=H1195413A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19990409&amp;DB=EPODOC&amp;CC=JP&amp;NR=H1195413A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OKADA IKUO</creatorcontrib><creatorcontrib>MATSUDA KOREHITO</creatorcontrib><creatorcontrib>SEKIMOTO MISAO</creatorcontrib><title>MASK STORAGE DEVICE</title><description>PROBLEM TO BE SOLVED: To decompose and remove defect causing materials sticking to a mask and to always ensure clean mask quality as well as to prevent the occurrence of defects on the mask during storage. SOLUTION: A wall 2 made of a photocatalytic material and an illumination light source 3 capable of exciting photocatalytic reaction are disposed in a housing vessel 1 for housing a mask 4. When the wall 2 is irradiated with UV from the light source 3, excited active oxygen radicals etc., are generated from the surface of the wall 2 and photocatalytic reaction accompanied by strong oxidation-reduction action is caused. By the reaction, gaseous impurities etc., existing in atmospheric gas 5, are converted into harmless inorg. ions after decomposition, e.g. into gaseous CO2 and H2 . Defect causing materials do not stick to the mask 4 and the occurrence of defects on the mask 4 can be prevented.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD2dQz2VggO8Q9ydHdVcHEN83R25WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGlqYmhsaOxkQoAQAZyB37</recordid><startdate>19990409</startdate><enddate>19990409</enddate><creator>OKADA IKUO</creator><creator>MATSUDA KOREHITO</creator><creator>SEKIMOTO MISAO</creator><scope>EVB</scope></search><sort><creationdate>19990409</creationdate><title>MASK STORAGE DEVICE</title><author>OKADA IKUO ; MATSUDA KOREHITO ; SEKIMOTO MISAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH1195413A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>OKADA IKUO</creatorcontrib><creatorcontrib>MATSUDA KOREHITO</creatorcontrib><creatorcontrib>SEKIMOTO MISAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OKADA IKUO</au><au>MATSUDA KOREHITO</au><au>SEKIMOTO MISAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MASK STORAGE DEVICE</title><date>1999-04-09</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To decompose and remove defect causing materials sticking to a mask and to always ensure clean mask quality as well as to prevent the occurrence of defects on the mask during storage. SOLUTION: A wall 2 made of a photocatalytic material and an illumination light source 3 capable of exciting photocatalytic reaction are disposed in a housing vessel 1 for housing a mask 4. When the wall 2 is irradiated with UV from the light source 3, excited active oxygen radicals etc., are generated from the surface of the wall 2 and photocatalytic reaction accompanied by strong oxidation-reduction action is caused. By the reaction, gaseous impurities etc., existing in atmospheric gas 5, are converted into harmless inorg. ions after decomposition, e.g. into gaseous CO2 and H2 . Defect causing materials do not stick to the mask 4 and the occurrence of defects on the mask 4 can be prevented.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPH1195413A
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
BASIC ELECTRIC ELEMENTS
CINEMATOGRAPHY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
title MASK STORAGE DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T05%3A38%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OKADA%20IKUO&rft.date=1999-04-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH1195413A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true