IMAGE PROCESSING DEVICE AND ITS MEASUREMENT ITEM INSPECTION METHOD

PROBLEM TO BE SOLVED: To detect a correct edge position even in the case where the surface state of an inspection object is no good or the lighting in an inspection environment is not uniform. SOLUTION: Previously, a threshold value for temporary measurement and a threshold value for real measuremen...

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Bibliographische Detailangaben

1. Verfasser:	NATSUME SHINJI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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