CIRCUIT BOARD INSPECTION DEVICE
PROBLEM TO BE SOLVED: To prevent damage of a circuit board of an inspection object, pin probes and inspection jigs by arranging a telescopically constituted pressing member for pressing a circuit board holding means. SOLUTION: When a moving means 6 moves a first inspection jig 3 toward a circuit boa...
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| creator | OGIWARA SHINJI HORI SEIICHI YAMAKOSHI HIDETO |
| description | PROBLEM TO BE SOLVED: To prevent damage of a circuit board of an inspection object, pin probes and inspection jigs by arranging a telescopically constituted pressing member for pressing a circuit board holding means. SOLUTION: When a moving means 6 moves a first inspection jig 3 toward a circuit board means 21 side holding a circuit board P, a telescopically constituted pressing member 33 contacts with the circuit board holding means 21. Next, when the inspection jig 3 is moved further, the pressing member 33 moves the circuit board holding means 21 toward a second inspection jig 4 in a slightly compressed state while pressing the circuit board holding means 21. In this case, since a pin probe 31 moves without contacting with a circuit board P, damage of the pin probe 31 and the circuit board P is prevented. The pin probes 31, 41 of both inspection jigs 3, 4 simultaneously contact with the circuit board P thereafter so as to prevent damage of the circuit board P and the pin probes 31, 41 caused when one side contacts earlier with the circuit board P. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH11344539A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH11344539A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH11344539A3</originalsourceid><addsrcrecordid>eNrjZJB39gxyDvUMUXDydwxyUfD0Cw5wdQ7x9PdTcHEN83R25WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGxiYmpsaWjsbEqAEA1Jkhyw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CIRCUIT BOARD INSPECTION DEVICE</title><source>esp@cenet</source><creator>OGIWARA SHINJI ; HORI SEIICHI ; YAMAKOSHI HIDETO</creator><creatorcontrib>OGIWARA SHINJI ; HORI SEIICHI ; YAMAKOSHI HIDETO</creatorcontrib><description>PROBLEM TO BE SOLVED: To prevent damage of a circuit board of an inspection object, pin probes and inspection jigs by arranging a telescopically constituted pressing member for pressing a circuit board holding means. SOLUTION: When a moving means 6 moves a first inspection jig 3 toward a circuit board means 21 side holding a circuit board P, a telescopically constituted pressing member 33 contacts with the circuit board holding means 21. Next, when the inspection jig 3 is moved further, the pressing member 33 moves the circuit board holding means 21 toward a second inspection jig 4 in a slightly compressed state while pressing the circuit board holding means 21. In this case, since a pin probe 31 moves without contacting with a circuit board P, damage of the pin probe 31 and the circuit board P is prevented. The pin probes 31, 41 of both inspection jigs 3, 4 simultaneously contact with the circuit board P thereafter so as to prevent damage of the circuit board P and the pin probes 31, 41 caused when one side contacts earlier with the circuit board P.</description><edition>6</edition><language>eng</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRINTED CIRCUITS ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19991214&DB=EPODOC&CC=JP&NR=H11344539A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19991214&DB=EPODOC&CC=JP&NR=H11344539A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OGIWARA SHINJI</creatorcontrib><creatorcontrib>HORI SEIICHI</creatorcontrib><creatorcontrib>YAMAKOSHI HIDETO</creatorcontrib><title>CIRCUIT BOARD INSPECTION DEVICE</title><description>PROBLEM TO BE SOLVED: To prevent damage of a circuit board of an inspection object, pin probes and inspection jigs by arranging a telescopically constituted pressing member for pressing a circuit board holding means. SOLUTION: When a moving means 6 moves a first inspection jig 3 toward a circuit board means 21 side holding a circuit board P, a telescopically constituted pressing member 33 contacts with the circuit board holding means 21. Next, when the inspection jig 3 is moved further, the pressing member 33 moves the circuit board holding means 21 toward a second inspection jig 4 in a slightly compressed state while pressing the circuit board holding means 21. In this case, since a pin probe 31 moves without contacting with a circuit board P, damage of the pin probe 31 and the circuit board P is prevented. The pin probes 31, 41 of both inspection jigs 3, 4 simultaneously contact with the circuit board P thereafter so as to prevent damage of the circuit board P and the pin probes 31, 41 caused when one side contacts earlier with the circuit board P.</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB39gxyDvUMUXDydwxyUfD0Cw5wdQ7x9PdTcHEN83R25WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGxiYmpsaWjsbEqAEA1Jkhyw</recordid><startdate>19991214</startdate><enddate>19991214</enddate><creator>OGIWARA SHINJI</creator><creator>HORI SEIICHI</creator><creator>YAMAKOSHI HIDETO</creator><scope>EVB</scope></search><sort><creationdate>19991214</creationdate><title>CIRCUIT BOARD INSPECTION DEVICE</title><author>OGIWARA SHINJI ; HORI SEIICHI ; YAMAKOSHI HIDETO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH11344539A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OGIWARA SHINJI</creatorcontrib><creatorcontrib>HORI SEIICHI</creatorcontrib><creatorcontrib>YAMAKOSHI HIDETO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OGIWARA SHINJI</au><au>HORI SEIICHI</au><au>YAMAKOSHI HIDETO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CIRCUIT BOARD INSPECTION DEVICE</title><date>1999-12-14</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To prevent damage of a circuit board of an inspection object, pin probes and inspection jigs by arranging a telescopically constituted pressing member for pressing a circuit board holding means. SOLUTION: When a moving means 6 moves a first inspection jig 3 toward a circuit board means 21 side holding a circuit board P, a telescopically constituted pressing member 33 contacts with the circuit board holding means 21. Next, when the inspection jig 3 is moved further, the pressing member 33 moves the circuit board holding means 21 toward a second inspection jig 4 in a slightly compressed state while pressing the circuit board holding means 21. In this case, since a pin probe 31 moves without contacting with a circuit board P, damage of the pin probe 31 and the circuit board P is prevented. The pin probes 31, 41 of both inspection jigs 3, 4 simultaneously contact with the circuit board P thereafter so as to prevent damage of the circuit board P and the pin probes 31, 41 caused when one side contacts earlier with the circuit board P.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING |
| title | CIRCUIT BOARD INSPECTION DEVICE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T22%3A49%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OGIWARA%20SHINJI&rft.date=1999-12-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH11344539A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |