STRONG MAGNETIC FIELD LOW-TEMPERATURE DEVICE FOR MEASURING PHYSICAL PROPERTY

PROBLEM TO BE SOLVED: To provide a strong magnetic field low-temperature device for measuring physical properties, which is simple and easy in operation and is capable of reducing initial costs or running costs for cooling a sample, without the need for the filling and replenishment of a refrigerant...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HASEBE TSUGINORI
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!