VOLTAGE DETECTION CIRCUIT
PROBLEM TO BE SOLVED: To provide a detection circuit normally outputs a detection signal of a power supply voltage even if the power supply voltage is low or suddenly changed. SOLUTION: This circuit comprises a first reference voltage generation circuit 10A supplying the first reference voltage to a...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HIRANO HIROSHIGE ASARI KOJI |
| description | PROBLEM TO BE SOLVED: To provide a detection circuit normally outputs a detection signal of a power supply voltage even if the power supply voltage is low or suddenly changed. SOLUTION: This circuit comprises a first reference voltage generation circuit 10A supplying the first reference voltage to a node N11A, a control voltage generation circuit 20 generating a control voltage at a node N12, a N-channel type MOS transistor Qn121 where a gate placed between a ground terminal and a node N13 is connected to a node N11A, and a P-channel type MOS transistor Qp121 where a gate placed between a power supply terminal and a node N13 is connected to N12. Since the circuit controls the P-channel type MOS transistor Qp121 by the control voltage and flows a current into the MOS transistor Qp121, the circuit can surely output a voltage detection signal VDTA through the node 13. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH11326398A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH11326398A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH11326398A3</originalsourceid><addsrcrecordid>eNrjZJAM8_cJcXR3VXBxDXF1DvH091Nw9gxyDvUM4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGxkZmxpYWjsbEqAEAHrsgSA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VOLTAGE DETECTION CIRCUIT</title><source>esp@cenet</source><creator>HIRANO HIROSHIGE ; ASARI KOJI</creator><creatorcontrib>HIRANO HIROSHIGE ; ASARI KOJI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a detection circuit normally outputs a detection signal of a power supply voltage even if the power supply voltage is low or suddenly changed. SOLUTION: This circuit comprises a first reference voltage generation circuit 10A supplying the first reference voltage to a node N11A, a control voltage generation circuit 20 generating a control voltage at a node N12, a N-channel type MOS transistor Qn121 where a gate placed between a ground terminal and a node N13 is connected to a node N11A, and a P-channel type MOS transistor Qp121 where a gate placed between a power supply terminal and a node N13 is connected to N12. Since the circuit controls the P-channel type MOS transistor Qp121 by the control voltage and flows a current into the MOS transistor Qp121, the circuit can surely output a voltage detection signal VDTA through the node 13.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19991126&DB=EPODOC&CC=JP&NR=H11326398A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19991126&DB=EPODOC&CC=JP&NR=H11326398A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRANO HIROSHIGE</creatorcontrib><creatorcontrib>ASARI KOJI</creatorcontrib><title>VOLTAGE DETECTION CIRCUIT</title><description>PROBLEM TO BE SOLVED: To provide a detection circuit normally outputs a detection signal of a power supply voltage even if the power supply voltage is low or suddenly changed. SOLUTION: This circuit comprises a first reference voltage generation circuit 10A supplying the first reference voltage to a node N11A, a control voltage generation circuit 20 generating a control voltage at a node N12, a N-channel type MOS transistor Qn121 where a gate placed between a ground terminal and a node N13 is connected to a node N11A, and a P-channel type MOS transistor Qp121 where a gate placed between a power supply terminal and a node N13 is connected to N12. Since the circuit controls the P-channel type MOS transistor Qp121 by the control voltage and flows a current into the MOS transistor Qp121, the circuit can surely output a voltage detection signal VDTA through the node 13.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAM8_cJcXR3VXBxDXF1DvH091Nw9gxyDvUM4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGxkZmxpYWjsbEqAEAHrsgSA</recordid><startdate>19991126</startdate><enddate>19991126</enddate><creator>HIRANO HIROSHIGE</creator><creator>ASARI KOJI</creator><scope>EVB</scope></search><sort><creationdate>19991126</creationdate><title>VOLTAGE DETECTION CIRCUIT</title><author>HIRANO HIROSHIGE ; ASARI KOJI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH11326398A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRANO HIROSHIGE</creatorcontrib><creatorcontrib>ASARI KOJI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRANO HIROSHIGE</au><au>ASARI KOJI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VOLTAGE DETECTION CIRCUIT</title><date>1999-11-26</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To provide a detection circuit normally outputs a detection signal of a power supply voltage even if the power supply voltage is low or suddenly changed. SOLUTION: This circuit comprises a first reference voltage generation circuit 10A supplying the first reference voltage to a node N11A, a control voltage generation circuit 20 generating a control voltage at a node N12, a N-channel type MOS transistor Qn121 where a gate placed between a ground terminal and a node N13 is connected to a node N11A, and a P-channel type MOS transistor Qp121 where a gate placed between a power supply terminal and a node N13 is connected to N12. Since the circuit controls the P-channel type MOS transistor Qp121 by the control voltage and flows a current into the MOS transistor Qp121, the circuit can surely output a voltage detection signal VDTA through the node 13.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JPH11326398A |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | VOLTAGE DETECTION CIRCUIT |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T20%3A01%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIRANO%20HIROSHIGE&rft.date=1999-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH11326398A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |