SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE

PROBLEM TO BE SOLVED: To precisely cut a sample to a fixed length and effectively remove a sample outside an allowance by jointly using lower reference control of a descend limit stopper and upper reference control of a positioning sensor. SOLUTION: The positioning control using a descend limit stop...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SASAKI AKIRA, MATSUNAGA HIDEKI, TAKEO KENJI, OKADA TOMOKI, MATSUDA SHUNSAKU
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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