SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE
PROBLEM TO BE SOLVED: To precisely cut a sample to a fixed length and effectively remove a sample outside an allowance by jointly using lower reference control of a descend limit stopper and upper reference control of a positioning sensor. SOLUTION: The positioning control using a descend limit stop...
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creator | SASAKI AKIRA MATSUNAGA HIDEKI TAKEO KENJI OKADA TOMOKI MATSUDA SHUNSAKU |
description | PROBLEM TO BE SOLVED: To precisely cut a sample to a fixed length and effectively remove a sample outside an allowance by jointly using lower reference control of a descend limit stopper and upper reference control of a positioning sensor. SOLUTION: The positioning control using a descend limit stopper 35 which is lower reference, and the stop position control using a probe elevating motor 20 and a position detecting an absolute encoder 30 which is upper reference are simultaneously conducted, whereby even if hard line wash adheres to the lower end of a probe 25, it is crushed, the probe 25 can be stopped by the descend limit stopper 35, and variation of probe installation depth and mechanical rattle can be absorbed to ensure the target accuracy of the cutting stop position. Further, when the tip of the probe 25 is burnt down, the probe 25 is forced to descend to the final forced descend position, a motor 20 is stopped, a brake is instantaneously released to freely drop the probe 25, the upper part of a sample is cut by the burnt portion, and when the cut length is outside an allowable length, a defective signal is output to remove the sample. |
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SOLUTION: The positioning control using a descend limit stopper 35 which is lower reference, and the stop position control using a probe elevating motor 20 and a position detecting an absolute encoder 30 which is upper reference are simultaneously conducted, whereby even if hard line wash adheres to the lower end of a probe 25, it is crushed, the probe 25 can be stopped by the descend limit stopper 35, and variation of probe installation depth and mechanical rattle can be absorbed to ensure the target accuracy of the cutting stop position. Further, when the tip of the probe 25 is burnt down, the probe 25 is forced to descend to the final forced descend position, a motor 20 is stopped, a brake is instantaneously released to freely drop the probe 25, the upper part of a sample is cut by the burnt portion, and when the cut length is outside an allowable length, a defective signal is output to remove the sample.</description><edition>6</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990106&DB=EPODOC&CC=JP&NR=H112591A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990106&DB=EPODOC&CC=JP&NR=H112591A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SASAKI AKIRA</creatorcontrib><creatorcontrib>MATSUNAGA HIDEKI</creatorcontrib><creatorcontrib>TAKEO KENJI</creatorcontrib><creatorcontrib>OKADA TOMOKI</creatorcontrib><creatorcontrib>MATSUDA SHUNSAKU</creatorcontrib><title>SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE</title><description>PROBLEM TO BE SOLVED: To precisely cut a sample to a fixed length and effectively remove a sample outside an allowance by jointly using lower reference control of a descend limit stopper and upper reference control of a positioning sensor. SOLUTION: The positioning control using a descend limit stopper 35 which is lower reference, and the stop position control using a probe elevating motor 20 and a position detecting an absolute encoder 30 which is upper reference are simultaneously conducted, whereby even if hard line wash adheres to the lower end of a probe 25, it is crushed, the probe 25 can be stopped by the descend limit stopper 35, and variation of probe installation depth and mechanical rattle can be absorbed to ensure the target accuracy of the cutting stop position. Further, when the tip of the probe 25 is burnt down, the probe 25 is forced to descend to the final forced descend position, a motor 20 is stopped, a brake is instantaneously released to freely drop the probe 25, the upper part of a sample is cut by the burnt portion, and when the cut length is outside an allowable length, a defective signal is output to remove the sample.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHANdvQN8HFVcA4NCfH0c1cI8A_2DPH091Nw9vcLCfL3UfB1DfHwd1Hw9FOAqgzwdHUGkc7eIPUurmGezq48DKxpiTnFqbxQmptB3s01xNlDN7UgPz61uCAxOTUvtSTeK8DD0NDI1NLQ0ZiwCgDiuCtb</recordid><startdate>19990106</startdate><enddate>19990106</enddate><creator>SASAKI AKIRA</creator><creator>MATSUNAGA HIDEKI</creator><creator>TAKEO KENJI</creator><creator>OKADA TOMOKI</creator><creator>MATSUDA SHUNSAKU</creator><scope>EVB</scope></search><sort><creationdate>19990106</creationdate><title>SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE</title><author>SASAKI AKIRA ; MATSUNAGA HIDEKI ; TAKEO KENJI ; OKADA TOMOKI ; MATSUDA SHUNSAKU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH112591A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SASAKI AKIRA</creatorcontrib><creatorcontrib>MATSUNAGA HIDEKI</creatorcontrib><creatorcontrib>TAKEO KENJI</creatorcontrib><creatorcontrib>OKADA TOMOKI</creatorcontrib><creatorcontrib>MATSUDA SHUNSAKU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SASAKI AKIRA</au><au>MATSUNAGA HIDEKI</au><au>TAKEO KENJI</au><au>OKADA TOMOKI</au><au>MATSUDA SHUNSAKU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE</title><date>1999-01-06</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To precisely cut a sample to a fixed length and effectively remove a sample outside an allowance by jointly using lower reference control of a descend limit stopper and upper reference control of a positioning sensor. SOLUTION: The positioning control using a descend limit stopper 35 which is lower reference, and the stop position control using a probe elevating motor 20 and a position detecting an absolute encoder 30 which is upper reference are simultaneously conducted, whereby even if hard line wash adheres to the lower end of a probe 25, it is crushed, the probe 25 can be stopped by the descend limit stopper 35, and variation of probe installation depth and mechanical rattle can be absorbed to ensure the target accuracy of the cutting stop position. Further, when the tip of the probe 25 is burnt down, the probe 25 is forced to descend to the final forced descend position, a motor 20 is stopped, a brake is instantaneously released to freely drop the probe 25, the upper part of a sample is cut by the burnt portion, and when the cut length is outside an allowable length, a defective signal is output to remove the sample.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | SAMPLE CUTTING POSITION CONTROL METHOD IN SAMPLE PIECE PICKING DEVICE |
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