SAMPLE PREPARING METHOD

PROBLEM TO BE SOLVED: To provide a method for safely preparing a sample before guiding the sample into a system (inductively coupled plasma means: ICP) for analysis. SOLUTION: A liquefied sample is sealed in a foaming device 21, carrier gas is foamed in the liquefied gas, at least part of the sample...

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Hauptverfasser: HUTTON ROBERT C, COONS DARRELL E, ALLEN RAYMOND H, STREUSAND BARRY J
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creator HUTTON ROBERT C
COONS DARRELL E
ALLEN RAYMOND H
STREUSAND BARRY J
description PROBLEM TO BE SOLVED: To provide a method for safely preparing a sample before guiding the sample into a system (inductively coupled plasma means: ICP) for analysis. SOLUTION: A liquefied sample is sealed in a foaming device 21, carrier gas is foamed in the liquefied gas, at least part of the sample is carried on the flow of the carrier gas, and the carrier gas flow carrying the sample to an evaporator passes to a line 24 under the proper pressure higher than the atmospheric pressure. The line 24 is branched into a line extended to a check valve 28 and a discharge 1' line extended to a gas flow adjusting means 25. Part of the gas flow passes through the gas flow adjusting means 25 and flows into an ICP 5. The remaining gas flow passes through the check valve 28 and reaches a washer 29 containing a solution resolving the sample, the sample is separated from the carrier gas, only the carrier gas is discharged from the washer 29, and the sample is not discharged into the atmosphere.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH11183388A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH11183388A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH11183388A3</originalsourceid><addsrcrecordid>eNrjZBAPdvQN8HFVCAhyDXAM8vRzV_B1DfHwd-FhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR6GhoYWxsYWFo7GxKgBANtDH60</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SAMPLE PREPARING METHOD</title><source>esp@cenet</source><creator>HUTTON ROBERT C ; COONS DARRELL E ; ALLEN RAYMOND H ; STREUSAND BARRY J</creator><creatorcontrib>HUTTON ROBERT C ; COONS DARRELL E ; ALLEN RAYMOND H ; STREUSAND BARRY J</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a method for safely preparing a sample before guiding the sample into a system (inductively coupled plasma means: ICP) for analysis. SOLUTION: A liquefied sample is sealed in a foaming device 21, carrier gas is foamed in the liquefied gas, at least part of the sample is carried on the flow of the carrier gas, and the carrier gas flow carrying the sample to an evaporator passes to a line 24 under the proper pressure higher than the atmospheric pressure. The line 24 is branched into a line extended to a check valve 28 and a discharge 1' line extended to a gas flow adjusting means 25. Part of the gas flow passes through the gas flow adjusting means 25 and flows into an ICP 5. The remaining gas flow passes through the check valve 28 and reaches a washer 29 containing a solution resolving the sample, the sample is separated from the carrier gas, only the carrier gas is discharged from the washer 29, and the sample is not discharged into the atmosphere.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; PLASMA TECHNIQUE ; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS ; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19990709&amp;DB=EPODOC&amp;CC=JP&amp;NR=H11183388A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19990709&amp;DB=EPODOC&amp;CC=JP&amp;NR=H11183388A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUTTON ROBERT C</creatorcontrib><creatorcontrib>COONS DARRELL E</creatorcontrib><creatorcontrib>ALLEN RAYMOND H</creatorcontrib><creatorcontrib>STREUSAND BARRY J</creatorcontrib><title>SAMPLE PREPARING METHOD</title><description>PROBLEM TO BE SOLVED: To provide a method for safely preparing a sample before guiding the sample into a system (inductively coupled plasma means: ICP) for analysis. SOLUTION: A liquefied sample is sealed in a foaming device 21, carrier gas is foamed in the liquefied gas, at least part of the sample is carried on the flow of the carrier gas, and the carrier gas flow carrying the sample to an evaporator passes to a line 24 under the proper pressure higher than the atmospheric pressure. The line 24 is branched into a line extended to a check valve 28 and a discharge 1' line extended to a gas flow adjusting means 25. Part of the gas flow passes through the gas flow adjusting means 25 and flows into an ICP 5. The remaining gas flow passes through the check valve 28 and reaches a washer 29 containing a solution resolving the sample, the sample is separated from the carrier gas, only the carrier gas is discharged from the washer 29, and the sample is not discharged into the atmosphere.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PLASMA TECHNIQUE</subject><subject>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</subject><subject>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAPdvQN8HFVCAhyDXAM8vRzV_B1DfHwd-FhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR6GhoYWxsYWFo7GxKgBANtDH60</recordid><startdate>19990709</startdate><enddate>19990709</enddate><creator>HUTTON ROBERT C</creator><creator>COONS DARRELL E</creator><creator>ALLEN RAYMOND H</creator><creator>STREUSAND BARRY J</creator><scope>EVB</scope></search><sort><creationdate>19990709</creationdate><title>SAMPLE PREPARING METHOD</title><author>HUTTON ROBERT C ; COONS DARRELL E ; ALLEN RAYMOND H ; STREUSAND BARRY J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH11183388A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PLASMA TECHNIQUE</topic><topic>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</topic><topic>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUTTON ROBERT C</creatorcontrib><creatorcontrib>COONS DARRELL E</creatorcontrib><creatorcontrib>ALLEN RAYMOND H</creatorcontrib><creatorcontrib>STREUSAND BARRY J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUTTON ROBERT C</au><au>COONS DARRELL E</au><au>ALLEN RAYMOND H</au><au>STREUSAND BARRY J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SAMPLE PREPARING METHOD</title><date>1999-07-09</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To provide a method for safely preparing a sample before guiding the sample into a system (inductively coupled plasma means: ICP) for analysis. SOLUTION: A liquefied sample is sealed in a foaming device 21, carrier gas is foamed in the liquefied gas, at least part of the sample is carried on the flow of the carrier gas, and the carrier gas flow carrying the sample to an evaporator passes to a line 24 under the proper pressure higher than the atmospheric pressure. The line 24 is branched into a line extended to a check valve 28 and a discharge 1' line extended to a gas flow adjusting means 25. Part of the gas flow passes through the gas flow adjusting means 25 and flows into an ICP 5. The remaining gas flow passes through the check valve 28 and reaches a washer 29 containing a solution resolving the sample, the sample is separated from the carrier gas, only the carrier gas is discharged from the washer 29, and the sample is not discharged into the atmosphere.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PLASMA TECHNIQUE
PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS
PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS
TESTING
title SAMPLE PREPARING METHOD
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