APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD
PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which a liquid crystal driving board can be inspected with good accuracy, by a method wherein a low-frequency component is removed from an image signal obtained from reflected light from a dielectric reflecting film, and a binarization pro...
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| creator | ISHIHARA TERUMASA |
| description | PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which a liquid crystal driving board can be inspected with good accuracy, by a method wherein a low-frequency component is removed from an image signal obtained from reflected light from a dielectric reflecting film, and a binarization processing operation is performed. SOLUTION: Many pixel electrodes a2 are installed in a matrix shape on a liquid crystal driving board A. A modulator 1 is formed in such a way that a thin-film transparent electrode 1b is pasted on one face of a liquid crystal sheet 1a and that a semiconductor reflecting film 1c is vapor-deposited or pasted on the other face. The semiconductor reflecting film 1c is faced downward so as to be fixed to an inspection apparatus body. The liquid crystal driving board A is arranged so as to be faced by keeping a very small gap Δd in the lower part. A prescribed voltage is supplied to the pixel electrodes a2 and the transparent electrode 1b from a power-supply device 10. The modulator 1 is irradiated with light from a light source 4 via a beam splitter 3, a filter 5 and a lens 6. A reflected image from the semiconductor reflecting film 1c is photographed by a CCD camera 7. An image processor 8 removes a low-frequency component containing a DC component from its image signal so as to perform a binarization processing operation. A defective pixel electrode is detected, and its result is outputted to a monitor 9. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH11174106A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH11174106A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH11174106A3</originalsourceid><addsrcrecordid>eNrjZHB2DAhwDHIMCQ1WcPRzUfB1DfHwd1Fw8w9S8PQLDnB1DvH091Pwd1Pw8QwM9XRRcA6KDA5x9FFwCfIM8_RzV3Dydwxy4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGhuYmhgZmjsbEqAEAK9YrmA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD</title><source>esp@cenet</source><creator>ISHIHARA TERUMASA</creator><creatorcontrib>ISHIHARA TERUMASA</creatorcontrib><description>PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which a liquid crystal driving board can be inspected with good accuracy, by a method wherein a low-frequency component is removed from an image signal obtained from reflected light from a dielectric reflecting film, and a binarization processing operation is performed. SOLUTION: Many pixel electrodes a2 are installed in a matrix shape on a liquid crystal driving board A. A modulator 1 is formed in such a way that a thin-film transparent electrode 1b is pasted on one face of a liquid crystal sheet 1a and that a semiconductor reflecting film 1c is vapor-deposited or pasted on the other face. The semiconductor reflecting film 1c is faced downward so as to be fixed to an inspection apparatus body. The liquid crystal driving board A is arranged so as to be faced by keeping a very small gap Δd in the lower part. A prescribed voltage is supplied to the pixel electrodes a2 and the transparent electrode 1b from a power-supply device 10. The modulator 1 is irradiated with light from a light source 4 via a beam splitter 3, a filter 5 and a lens 6. A reflected image from the semiconductor reflecting film 1c is photographed by a CCD camera 7. An image processor 8 removes a low-frequency component containing a DC component from its image signal so as to perform a binarization processing operation. A defective pixel electrode is detected, and its result is outputted to a monitor 9.</description><edition>6</edition><language>eng</language><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; FREQUENCY-CHANGING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990702&DB=EPODOC&CC=JP&NR=H11174106A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990702&DB=EPODOC&CC=JP&NR=H11174106A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ISHIHARA TERUMASA</creatorcontrib><title>APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD</title><description>PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which a liquid crystal driving board can be inspected with good accuracy, by a method wherein a low-frequency component is removed from an image signal obtained from reflected light from a dielectric reflecting film, and a binarization processing operation is performed. SOLUTION: Many pixel electrodes a2 are installed in a matrix shape on a liquid crystal driving board A. A modulator 1 is formed in such a way that a thin-film transparent electrode 1b is pasted on one face of a liquid crystal sheet 1a and that a semiconductor reflecting film 1c is vapor-deposited or pasted on the other face. The semiconductor reflecting film 1c is faced downward so as to be fixed to an inspection apparatus body. The liquid crystal driving board A is arranged so as to be faced by keeping a very small gap Δd in the lower part. A prescribed voltage is supplied to the pixel electrodes a2 and the transparent electrode 1b from a power-supply device 10. The modulator 1 is irradiated with light from a light source 4 via a beam splitter 3, a filter 5 and a lens 6. A reflected image from the semiconductor reflecting film 1c is photographed by a CCD camera 7. An image processor 8 removes a low-frequency component containing a DC component from its image signal so as to perform a binarization processing operation. A defective pixel electrode is detected, and its result is outputted to a monitor 9.</description><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>FREQUENCY-CHANGING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB2DAhwDHIMCQ1WcPRzUfB1DfHwd1Fw8w9S8PQLDnB1DvH091Pwd1Pw8QwM9XRRcA6KDA5x9FFwCfIM8_RzV3Dydwxy4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHoaGhuYmhgZmjsbEqAEAK9YrmA</recordid><startdate>19990702</startdate><enddate>19990702</enddate><creator>ISHIHARA TERUMASA</creator><scope>EVB</scope></search><sort><creationdate>19990702</creationdate><title>APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD</title><author>ISHIHARA TERUMASA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH11174106A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>FREQUENCY-CHANGING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ISHIHARA TERUMASA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ISHIHARA TERUMASA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD</title><date>1999-07-02</date><risdate>1999</risdate><abstract>PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which a liquid crystal driving board can be inspected with good accuracy, by a method wherein a low-frequency component is removed from an image signal obtained from reflected light from a dielectric reflecting film, and a binarization processing operation is performed. SOLUTION: Many pixel electrodes a2 are installed in a matrix shape on a liquid crystal driving board A. A modulator 1 is formed in such a way that a thin-film transparent electrode 1b is pasted on one face of a liquid crystal sheet 1a and that a semiconductor reflecting film 1c is vapor-deposited or pasted on the other face. The semiconductor reflecting film 1c is faced downward so as to be fixed to an inspection apparatus body. The liquid crystal driving board A is arranged so as to be faced by keeping a very small gap Δd in the lower part. A prescribed voltage is supplied to the pixel electrodes a2 and the transparent electrode 1b from a power-supply device 10. The modulator 1 is irradiated with light from a light source 4 via a beam splitter 3, a filter 5 and a lens 6. A reflected image from the semiconductor reflecting film 1c is photographed by a CCD camera 7. An image processor 8 removes a low-frequency component containing a DC component from its image signal so as to perform a binarization processing operation. A defective pixel electrode is detected, and its result is outputted to a monitor 9.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| subjects | DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | APPARATUS AND METHOD FOR INSPECTION OF LIQUID CRYSTAL DRIVING BOARD |
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