DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To effectively discharge the static electricity in the manufacturing steps by a method wherein a semiconductor device sealed with a mold resin having the characteristic of volume resistivity inversely proportional to the temperature is heat-treated. SOLUTION: The volume resisti...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: WAKITA YUKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WAKITA YUKI
description PROBLEM TO BE SOLVED: To effectively discharge the static electricity in the manufacturing steps by a method wherein a semiconductor device sealed with a mold resin having the characteristic of volume resistivity inversely proportional to the temperature is heat-treated. SOLUTION: The volume resistitivty of a mold resin 4 comprising the package contour e.g. an epoxy resin is reduced by the temperature fluctuation by heat-treating the whole semiconductor 1. Accordingly, the transferred charge per unit time is increased for accelerating the transfer rate of the charge. Thus, the charge accumulated in the semiconductor 1 is externally transferred along the surface of the mold resin 4 through the intermediary of a low potential parts e.g. so-called outerleads externally protruded. Furthermore, in addition to the charge transfer, the water content in the resin 4 by the moisture absorption of the mold resin 4 is evaporated by the heat treatment. Through these procedures, the charge accumulated in the semiconductor 1 is discharged into the air together with the steam.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH10178120A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH10178120A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH10178120A3</originalsourceid><addsrcrecordid>eNrjZDB38Qx29nAMcvf0c1fwdQ3x8HdR8HdTCHIN9vRTCHZ19HF1AVK-ns7-fi6hziH-QQourmGezq48DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTeK8DD0MDQ3MLQyMDRmBg1ADPwKD8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>WAKITA YUKI</creator><creatorcontrib>WAKITA YUKI</creatorcontrib><description>PROBLEM TO BE SOLVED: To effectively discharge the static electricity in the manufacturing steps by a method wherein a semiconductor device sealed with a mold resin having the characteristic of volume resistivity inversely proportional to the temperature is heat-treated. SOLUTION: The volume resistitivty of a mold resin 4 comprising the package contour e.g. an epoxy resin is reduced by the temperature fluctuation by heat-treating the whole semiconductor 1. Accordingly, the transferred charge per unit time is increased for accelerating the transfer rate of the charge. Thus, the charge accumulated in the semiconductor 1 is externally transferred along the surface of the mold resin 4 through the intermediary of a low potential parts e.g. so-called outerleads externally protruded. Furthermore, in addition to the charge transfer, the water content in the resin 4 by the moisture absorption of the mold resin 4 is evaporated by the heat treatment. Through these procedures, the charge accumulated in the semiconductor 1 is discharged into the air together with the steam.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19980630&amp;DB=EPODOC&amp;CC=JP&amp;NR=H10178120A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19980630&amp;DB=EPODOC&amp;CC=JP&amp;NR=H10178120A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WAKITA YUKI</creatorcontrib><title>DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To effectively discharge the static electricity in the manufacturing steps by a method wherein a semiconductor device sealed with a mold resin having the characteristic of volume resistivity inversely proportional to the temperature is heat-treated. SOLUTION: The volume resistitivty of a mold resin 4 comprising the package contour e.g. an epoxy resin is reduced by the temperature fluctuation by heat-treating the whole semiconductor 1. Accordingly, the transferred charge per unit time is increased for accelerating the transfer rate of the charge. Thus, the charge accumulated in the semiconductor 1 is externally transferred along the surface of the mold resin 4 through the intermediary of a low potential parts e.g. so-called outerleads externally protruded. Furthermore, in addition to the charge transfer, the water content in the resin 4 by the moisture absorption of the mold resin 4 is evaporated by the heat treatment. Through these procedures, the charge accumulated in the semiconductor 1 is discharged into the air together with the steam.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB38Qx29nAMcvf0c1fwdQ3x8HdR8HdTCHIN9vRTCHZ19HF1AVK-ns7-fi6hziH-QQourmGezq48DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTeK8DD0MDQ3MLQyMDRmBg1ADPwKD8</recordid><startdate>19980630</startdate><enddate>19980630</enddate><creator>WAKITA YUKI</creator><scope>EVB</scope></search><sort><creationdate>19980630</creationdate><title>DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE</title><author>WAKITA YUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH10178120A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1998</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>WAKITA YUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WAKITA YUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE</title><date>1998-06-30</date><risdate>1998</risdate><abstract>PROBLEM TO BE SOLVED: To effectively discharge the static electricity in the manufacturing steps by a method wherein a semiconductor device sealed with a mold resin having the characteristic of volume resistivity inversely proportional to the temperature is heat-treated. SOLUTION: The volume resistitivty of a mold resin 4 comprising the package contour e.g. an epoxy resin is reduced by the temperature fluctuation by heat-treating the whole semiconductor 1. Accordingly, the transferred charge per unit time is increased for accelerating the transfer rate of the charge. Thus, the charge accumulated in the semiconductor 1 is externally transferred along the surface of the mold resin 4 through the intermediary of a low potential parts e.g. so-called outerleads externally protruded. Furthermore, in addition to the charge transfer, the water content in the resin 4 by the moisture absorption of the mold resin 4 is evaporated by the heat treatment. Through these procedures, the charge accumulated in the semiconductor 1 is discharged into the air together with the steam.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPH10178120A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title DISCHARGING METHOD OF RESIN SEALED SEMICONDUCTOR DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T00%3A00%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WAKITA%20YUKI&rft.date=1998-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH10178120A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true