SCANNING OPTICAL SYSTEM EVALUATING DEVICE

PROBLEM TO BE SOLVED: To precisely evaluate a scanning optical system over the whole area in main scanning direction. SOLUTION: An area sensor 9 is movably provided in the scanning direction of a laser beam scanned by a polygon mirror 4. The detection signal of the laser beam by this area sensor 9 i...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TODA TSUNEO, SHIOTANI KOHEI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator TODA TSUNEO
SHIOTANI KOHEI
description PROBLEM TO BE SOLVED: To precisely evaluate a scanning optical system over the whole area in main scanning direction. SOLUTION: An area sensor 9 is movably provided in the scanning direction of a laser beam scanned by a polygon mirror 4. The detection signal of the laser beam by this area sensor 9 is read to a buffer memory 13 by a CCD driving circuit 12. Further, the main scanning directional signal inputted to the buffer memory 13 is copied in sub-scanning direction by an image composing part 14, and extended to a two-dimensional image. A comparative arithmetic part 16 determines the differential value between the two-dimensional image and a master image. A host computer 10 detects the abnormality of the laser beam by the differential value and evaluates a scanning device.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH0933390A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH0933390A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH0933390A3</originalsourceid><addsrcrecordid>eNrjZNAMdnb08_P0c1fwDwjxdHb0UQiODA5x9VVwDXP0CXUMAcm4uIZ5OrvyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ4rwAPA0tjY2NLA0djIpQAAPhlJEg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SCANNING OPTICAL SYSTEM EVALUATING DEVICE</title><source>esp@cenet</source><creator>TODA TSUNEO ; SHIOTANI KOHEI</creator><creatorcontrib>TODA TSUNEO ; SHIOTANI KOHEI</creatorcontrib><description>PROBLEM TO BE SOLVED: To precisely evaluate a scanning optical system over the whole area in main scanning direction. SOLUTION: An area sensor 9 is movably provided in the scanning direction of a laser beam scanned by a polygon mirror 4. The detection signal of the laser beam by this area sensor 9 is read to a buffer memory 13 by a CCD driving circuit 12. Further, the main scanning directional signal inputted to the buffer memory 13 is copied in sub-scanning direction by an image composing part 14, and extended to a two-dimensional image. A comparative arithmetic part 16 determines the differential value between the two-dimensional image and a master image. A host computer 10 detects the abnormality of the laser beam by the differential value and evaluates a scanning device.</description><edition>6</edition><language>eng</language><subject>MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>1997</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19970207&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0933390A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19970207&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0933390A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TODA TSUNEO</creatorcontrib><creatorcontrib>SHIOTANI KOHEI</creatorcontrib><title>SCANNING OPTICAL SYSTEM EVALUATING DEVICE</title><description>PROBLEM TO BE SOLVED: To precisely evaluate a scanning optical system over the whole area in main scanning direction. SOLUTION: An area sensor 9 is movably provided in the scanning direction of a laser beam scanned by a polygon mirror 4. The detection signal of the laser beam by this area sensor 9 is read to a buffer memory 13 by a CCD driving circuit 12. Further, the main scanning directional signal inputted to the buffer memory 13 is copied in sub-scanning direction by an image composing part 14, and extended to a two-dimensional image. A comparative arithmetic part 16 determines the differential value between the two-dimensional image and a master image. A host computer 10 detects the abnormality of the laser beam by the differential value and evaluates a scanning device.</description><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAMdnb08_P0c1fwDwjxdHb0UQiODA5x9VVwDXP0CXUMAcm4uIZ5OrvyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ4rwAPA0tjY2NLA0djIpQAAPhlJEg</recordid><startdate>19970207</startdate><enddate>19970207</enddate><creator>TODA TSUNEO</creator><creator>SHIOTANI KOHEI</creator><scope>EVB</scope></search><sort><creationdate>19970207</creationdate><title>SCANNING OPTICAL SYSTEM EVALUATING DEVICE</title><author>TODA TSUNEO ; SHIOTANI KOHEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH0933390A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>TODA TSUNEO</creatorcontrib><creatorcontrib>SHIOTANI KOHEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TODA TSUNEO</au><au>SHIOTANI KOHEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SCANNING OPTICAL SYSTEM EVALUATING DEVICE</title><date>1997-02-07</date><risdate>1997</risdate><abstract>PROBLEM TO BE SOLVED: To precisely evaluate a scanning optical system over the whole area in main scanning direction. SOLUTION: An area sensor 9 is movably provided in the scanning direction of a laser beam scanned by a polygon mirror 4. The detection signal of the laser beam by this area sensor 9 is read to a buffer memory 13 by a CCD driving circuit 12. Further, the main scanning directional signal inputted to the buffer memory 13 is copied in sub-scanning direction by an image composing part 14, and extended to a two-dimensional image. A comparative arithmetic part 16 determines the differential value between the two-dimensional image and a master image. A host computer 10 detects the abnormality of the laser beam by the differential value and evaluates a scanning device.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPH0933390A
source esp@cenet
subjects MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title SCANNING OPTICAL SYSTEM EVALUATING DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T10%3A42%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TODA%20TSUNEO&rft.date=1997-02-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH0933390A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true