MULTIPLE PROBE-SENDING DEVICE ASSEMBLY
PROBLEM TO BE SOLVED: To provide a multiple probe-sending device assembly which performs sending and drawback of a plurality of probes without generation of slip phenomenon and is capable of easily performing a repair work for individual proves even if a slip phenomenon generates. SOLUTION: The mult...
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| creator | NAKAYA SHIYUUSAKU MAKAWA TOSHIO |
| description | PROBLEM TO BE SOLVED: To provide a multiple probe-sending device assembly which performs sending and drawback of a plurality of probes without generation of slip phenomenon and is capable of easily performing a repair work for individual proves even if a slip phenomenon generates. SOLUTION: The multiple probe-sending device assembly 1 is provided with a plurality of sending devices 10 which each has a probe holding part to hold a probe 2 and reel drums 20 of the same numbers as the sending devices. The probe holding part of each sending device is provided with an endless flexible drive conveyor 13a for driving the prove and an endless flexible pushing conveyor 13b capable of controlling the pushing force. Each sending means has an individual driving device of drive conveyor and each reel drum 20 is individually rotatable. |
| format | Patent |
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SOLUTION: The multiple probe-sending device assembly 1 is provided with a plurality of sending devices 10 which each has a probe holding part to hold a probe 2 and reel drums 20 of the same numbers as the sending devices. The probe holding part of each sending device is provided with an endless flexible drive conveyor 13a for driving the prove and an endless flexible pushing conveyor 13b capable of controlling the pushing force. 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SOLUTION: The multiple probe-sending device assembly 1 is provided with a plurality of sending devices 10 which each has a probe holding part to hold a probe 2 and reel drums 20 of the same numbers as the sending devices. The probe holding part of each sending device is provided with an endless flexible drive conveyor 13a for driving the prove and an endless flexible pushing conveyor 13b capable of controlling the pushing force. Each sending means has an individual driving device of drive conveyor and each reel drum 20 is individually rotatable.</description><subject>CLEANING</subject><subject>CLEANING IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>NUCLEAR REACTORS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PREVENTION OF FOULING IN GENERAL</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDzDfUJ8QzwcVUICPJ3ctUNdvVz8fRzV3BxDfN0dlVwDA529XXyieRhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4GlsZGlmYWZo7GxKgBANLJI-4</recordid><startdate>19971222</startdate><enddate>19971222</enddate><creator>NAKAYA SHIYUUSAKU</creator><creator>MAKAWA TOSHIO</creator><scope>EVB</scope></search><sort><creationdate>19971222</creationdate><title>MULTIPLE PROBE-SENDING DEVICE ASSEMBLY</title><author>NAKAYA SHIYUUSAKU ; MAKAWA TOSHIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH09329686A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>CLEANING</topic><topic>CLEANING IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>NUCLEAR ENGINEERING</topic><topic>NUCLEAR PHYSICS</topic><topic>NUCLEAR REACTORS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PREVENTION OF FOULING IN GENERAL</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAYA SHIYUUSAKU</creatorcontrib><creatorcontrib>MAKAWA TOSHIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAYA SHIYUUSAKU</au><au>MAKAWA TOSHIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MULTIPLE PROBE-SENDING DEVICE ASSEMBLY</title><date>1997-12-22</date><risdate>1997</risdate><abstract>PROBLEM TO BE SOLVED: To provide a multiple probe-sending device assembly which performs sending and drawback of a plurality of probes without generation of slip phenomenon and is capable of easily performing a repair work for individual proves even if a slip phenomenon generates. SOLUTION: The multiple probe-sending device assembly 1 is provided with a plurality of sending devices 10 which each has a probe holding part to hold a probe 2 and reel drums 20 of the same numbers as the sending devices. The probe holding part of each sending device is provided with an endless flexible drive conveyor 13a for driving the prove and an endless flexible pushing conveyor 13b capable of controlling the pushing force. Each sending means has an individual driving device of drive conveyor and each reel drum 20 is individually rotatable.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | esp@cenet |
| subjects | CLEANING CLEANING IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS NUCLEAR REACTORS PERFORMING OPERATIONS PHYSICS PREVENTION OF FOULING IN GENERAL TESTING TRANSPORTING |
| title | MULTIPLE PROBE-SENDING DEVICE ASSEMBLY |
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