LEAK CURRENT COMPENSATING CIRCUIT
PROBLEM TO BE SOLVED: To provide a leak current compensating circuit where the leak current of a parasitic diode in the elements of IC and LSI is correctly compensated. SOLUTION: Two compensation diodes D1Cd and D1Cs connected to the same power source as the parasitic diode and two current mirror ci...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | OTA NORIKAZU NAGASE HIROSHI KITAGAWA FUMITAKA MIZUNO KENTAROU |
description | PROBLEM TO BE SOLVED: To provide a leak current compensating circuit where the leak current of a parasitic diode in the elements of IC and LSI is correctly compensated. SOLUTION: Two compensation diodes D1Cd and D1Cs connected to the same power source as the parasitic diode and two current mirror circuits 12 and 11 are provided and the first current mirror circuit 12 adopts the reverse direction leak current IL1 of the first compensation diode as input current and is provided with two outputs. Difference obtained by subtracting the reverse direction leak current IL2 of the second compensation diode from one side output current of the first current mirror circuit 12 is adopted as the input current IN0 of the second current mirror circuit 11 and difference current between the other side current of the second current mirror circuit 12 and the output current of the second current mirror circuit 11 is adopted as compensation current IC and supplied to the parasite diode D1d or drawn-out. For example, when the parasite diode D1d is low-biased, leak current compensation is executed by compensation current IC being equivalent to leak current IL2 which is permitted to flow by the second compensation diode D1Cs. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH09312530A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH09312530A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH09312530A3</originalsourceid><addsrcrecordid>eNrjZFD0cXX0VnAODQpy9QtRcPb3DXD1C3YM8fRzV3D2DHIO9QzhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgEeBpbGhkamxgaOxsSoAQAlCCJz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LEAK CURRENT COMPENSATING CIRCUIT</title><source>esp@cenet</source><creator>OTA NORIKAZU ; NAGASE HIROSHI ; KITAGAWA FUMITAKA ; MIZUNO KENTAROU</creator><creatorcontrib>OTA NORIKAZU ; NAGASE HIROSHI ; KITAGAWA FUMITAKA ; MIZUNO KENTAROU</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a leak current compensating circuit where the leak current of a parasitic diode in the elements of IC and LSI is correctly compensated. SOLUTION: Two compensation diodes D1Cd and D1Cs connected to the same power source as the parasitic diode and two current mirror circuits 12 and 11 are provided and the first current mirror circuit 12 adopts the reverse direction leak current IL1 of the first compensation diode as input current and is provided with two outputs. Difference obtained by subtracting the reverse direction leak current IL2 of the second compensation diode from one side output current of the first current mirror circuit 12 is adopted as the input current IN0 of the second current mirror circuit 11 and difference current between the other side current of the second current mirror circuit 12 and the output current of the second current mirror circuit 11 is adopted as compensation current IC and supplied to the parasite diode D1d or drawn-out. For example, when the parasite diode D1d is low-biased, leak current compensation is executed by compensation current IC being equivalent to leak current IL2 which is permitted to flow by the second compensation diode D1Cs.</description><edition>6</edition><language>eng</language><subject>AMPLIFIERS ; BASIC ELECTRIC ELEMENTS ; BASIC ELECTRONIC CIRCUITRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PULSE TECHNIQUE ; SEMICONDUCTOR DEVICES</subject><creationdate>1997</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971202&DB=EPODOC&CC=JP&NR=H09312530A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971202&DB=EPODOC&CC=JP&NR=H09312530A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OTA NORIKAZU</creatorcontrib><creatorcontrib>NAGASE HIROSHI</creatorcontrib><creatorcontrib>KITAGAWA FUMITAKA</creatorcontrib><creatorcontrib>MIZUNO KENTAROU</creatorcontrib><title>LEAK CURRENT COMPENSATING CIRCUIT</title><description>PROBLEM TO BE SOLVED: To provide a leak current compensating circuit where the leak current of a parasitic diode in the elements of IC and LSI is correctly compensated. SOLUTION: Two compensation diodes D1Cd and D1Cs connected to the same power source as the parasitic diode and two current mirror circuits 12 and 11 are provided and the first current mirror circuit 12 adopts the reverse direction leak current IL1 of the first compensation diode as input current and is provided with two outputs. Difference obtained by subtracting the reverse direction leak current IL2 of the second compensation diode from one side output current of the first current mirror circuit 12 is adopted as the input current IN0 of the second current mirror circuit 11 and difference current between the other side current of the second current mirror circuit 12 and the output current of the second current mirror circuit 11 is adopted as compensation current IC and supplied to the parasite diode D1d or drawn-out. For example, when the parasite diode D1d is low-biased, leak current compensation is executed by compensation current IC being equivalent to leak current IL2 which is permitted to flow by the second compensation diode D1Cs.</description><subject>AMPLIFIERS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PULSE TECHNIQUE</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0cXX0VnAODQpy9QtRcPb3DXD1C3YM8fRzV3D2DHIO9QzhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgEeBpbGhkamxgaOxsSoAQAlCCJz</recordid><startdate>19971202</startdate><enddate>19971202</enddate><creator>OTA NORIKAZU</creator><creator>NAGASE HIROSHI</creator><creator>KITAGAWA FUMITAKA</creator><creator>MIZUNO KENTAROU</creator><scope>EVB</scope></search><sort><creationdate>19971202</creationdate><title>LEAK CURRENT COMPENSATING CIRCUIT</title><author>OTA NORIKAZU ; NAGASE HIROSHI ; KITAGAWA FUMITAKA ; MIZUNO KENTAROU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH09312530A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>AMPLIFIERS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PULSE TECHNIQUE</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>OTA NORIKAZU</creatorcontrib><creatorcontrib>NAGASE HIROSHI</creatorcontrib><creatorcontrib>KITAGAWA FUMITAKA</creatorcontrib><creatorcontrib>MIZUNO KENTAROU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OTA NORIKAZU</au><au>NAGASE HIROSHI</au><au>KITAGAWA FUMITAKA</au><au>MIZUNO KENTAROU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LEAK CURRENT COMPENSATING CIRCUIT</title><date>1997-12-02</date><risdate>1997</risdate><abstract>PROBLEM TO BE SOLVED: To provide a leak current compensating circuit where the leak current of a parasitic diode in the elements of IC and LSI is correctly compensated. SOLUTION: Two compensation diodes D1Cd and D1Cs connected to the same power source as the parasitic diode and two current mirror circuits 12 and 11 are provided and the first current mirror circuit 12 adopts the reverse direction leak current IL1 of the first compensation diode as input current and is provided with two outputs. Difference obtained by subtracting the reverse direction leak current IL2 of the second compensation diode from one side output current of the first current mirror circuit 12 is adopted as the input current IN0 of the second current mirror circuit 11 and difference current between the other side current of the second current mirror circuit 12 and the output current of the second current mirror circuit 11 is adopted as compensation current IC and supplied to the parasite diode D1d or drawn-out. For example, when the parasite diode D1d is low-biased, leak current compensation is executed by compensation current IC being equivalent to leak current IL2 which is permitted to flow by the second compensation diode D1Cs.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JPH09312530A |
source | esp@cenet |
subjects | AMPLIFIERS BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PULSE TECHNIQUE SEMICONDUCTOR DEVICES |
title | LEAK CURRENT COMPENSATING CIRCUIT |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T23%3A01%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OTA%20NORIKAZU&rft.date=1997-12-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH09312530A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |