MEASURING METHOD FOR LATTICE DISTORTION OF CRYSTAL
PROBLEM TO BE SOLVED: To provide a method for detecting the correct lattice deflection of a crystal by correcting a nonuniform diffracted X-ray intensity distribution of an X-ray topograph that is not derived from the crystallinity of a sample crystal. SOLUTION: This measuring method uses an X-ray t...
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| creator | RYU KOSUKE KAWATO SEIJI KUDO YOSHIHIRO |
| description | PROBLEM TO BE SOLVED: To provide a method for detecting the correct lattice deflection of a crystal by correcting a nonuniform diffracted X-ray intensity distribution of an X-ray topograph that is not derived from the crystallinity of a sample crystal. SOLUTION: This measuring method uses an X-ray topograph taking optical system to take an X-ray topograph and, at the same time, measures a diffracted X-ray intensity curve. Next, the difference in Bragg condition of a sample crystal is calculated from the diffracted X-ray intensity curve, the peak intensity fluctuations of the diffracted X-ray intensity curve in continuous regions are calculated, and using these values, the diffracted X-ray intensity distribution of the X-ray topograph of the sample crystal is corrected; the fluctuation ratio Δd/(d) of the lattice spacing and the fluctuation Δα of the lattice azimuth, both of which do not contain components which are not derived from crystallinity, from the diffracted X-ray intensity distribution corrected are calculated. |
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SOLUTION: This measuring method uses an X-ray topograph taking optical system to take an X-ray topograph and, at the same time, measures a diffracted X-ray intensity curve. Next, the difference in Bragg condition of a sample crystal is calculated from the diffracted X-ray intensity curve, the peak intensity fluctuations of the diffracted X-ray intensity curve in continuous regions are calculated, and using these values, the diffracted X-ray intensity distribution of the X-ray topograph of the sample crystal is corrected; the fluctuation ratio Δd/(d) of the lattice spacing and the fluctuation Δα of the lattice azimuth, both of which do not contain components which are not derived from crystallinity, from the diffracted X-ray intensity distribution corrected are calculated.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1997</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971128&DB=EPODOC&CC=JP&NR=H09304307A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971128&DB=EPODOC&CC=JP&NR=H09304307A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RYU KOSUKE</creatorcontrib><creatorcontrib>KAWATO SEIJI</creatorcontrib><creatorcontrib>KUDO YOSHIHIRO</creatorcontrib><title>MEASURING METHOD FOR LATTICE DISTORTION OF CRYSTAL</title><description>PROBLEM TO BE SOLVED: To provide a method for detecting the correct lattice deflection of a crystal by correcting a nonuniform diffracted X-ray intensity distribution of an X-ray topograph that is not derived from the crystallinity of a sample crystal. SOLUTION: This measuring method uses an X-ray topograph taking optical system to take an X-ray topograph and, at the same time, measures a diffracted X-ray intensity curve. Next, the difference in Bragg condition of a sample crystal is calculated from the diffracted X-ray intensity curve, the peak intensity fluctuations of the diffracted X-ray intensity curve in continuous regions are calculated, and using these values, the diffracted X-ray intensity distribution of the X-ray topograph of the sample crystal is corrected; the fluctuation ratio Δd/(d) of the lattice spacing and the fluctuation Δα of the lattice azimuth, both of which do not contain components which are not derived from crystallinity, from the diffracted X-ray intensity distribution corrected are calculated.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDydXUMDg3y9HNX8HUN8fB3UXDzD1LwcQwJ8XR2VXDxDA7xDwrx9PdT8HdTcA6KDA5x9OFhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4GlsYGJsYG5o7GxKgBAI_cJy4</recordid><startdate>19971128</startdate><enddate>19971128</enddate><creator>RYU KOSUKE</creator><creator>KAWATO SEIJI</creator><creator>KUDO YOSHIHIRO</creator><scope>EVB</scope></search><sort><creationdate>19971128</creationdate><title>MEASURING METHOD FOR LATTICE DISTORTION OF CRYSTAL</title><author>RYU KOSUKE ; KAWATO SEIJI ; KUDO YOSHIHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH09304307A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RYU KOSUKE</creatorcontrib><creatorcontrib>KAWATO SEIJI</creatorcontrib><creatorcontrib>KUDO YOSHIHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RYU KOSUKE</au><au>KAWATO SEIJI</au><au>KUDO YOSHIHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING METHOD FOR LATTICE DISTORTION OF CRYSTAL</title><date>1997-11-28</date><risdate>1997</risdate><abstract>PROBLEM TO BE SOLVED: To provide a method for detecting the correct lattice deflection of a crystal by correcting a nonuniform diffracted X-ray intensity distribution of an X-ray topograph that is not derived from the crystallinity of a sample crystal. SOLUTION: This measuring method uses an X-ray topograph taking optical system to take an X-ray topograph and, at the same time, measures a diffracted X-ray intensity curve. Next, the difference in Bragg condition of a sample crystal is calculated from the diffracted X-ray intensity curve, the peak intensity fluctuations of the diffracted X-ray intensity curve in continuous regions are calculated, and using these values, the diffracted X-ray intensity distribution of the X-ray topograph of the sample crystal is corrected; the fluctuation ratio Δd/(d) of the lattice spacing and the fluctuation Δα of the lattice azimuth, both of which do not contain components which are not derived from crystallinity, from the diffracted X-ray intensity distribution corrected are calculated.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | MEASURING METHOD FOR LATTICE DISTORTION OF CRYSTAL |
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