MEASURING APPARATUS FOR OUTPUT RESISTANCE OF DRIVER IC

PROBLEM TO BE SOLVED: To obtain a measuring apparatus by which an output resistance can be measured with high accuracy by installing a threshold voltage source group used to set a voltage which is higher than the output voltage of a device (DUT) to be tested and a threshold voltage source group used...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ONO MUNENORI, NAGASHIMA MASATO, NAGATO YOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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