ELECTROSTATIC DISCHARGE STRUCTURE OF SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To avoid malfunctioning of an internal circuit by a method wherein an N-MOS transistor for electrostatic discharge is formed in a P-type pocket well isolated from a P-type semiconductor substrate. SOLUTION: An N-type source region 118 and an N-type drain region 122 by which a c...

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Bibliographische Detailangaben
Hauptverfasser: YANA TAKAKO, BOKU KITETSU
Format: Patent
Sprache:eng
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