DEVICE FOR PHOTOELECTRIC LENGTH MEASUREMENT OR ANGLE MEASUREMENT

PROBLEM TO BE SOLVED: To obtain a photoelectric length or angle measuring apparatus in which the measurements are insensitive to the local fluctuation in the measuring graduations being scanned and relatively insensitive to the fluctuation of scanning interval by deflecting at least a part of partia...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	BUARUTAA FUUBAA
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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