PHOTOSENSITIVE COMPOSITION

PURPOSE: To ensure high sensitivity for a photosensitive compsn., to suppress the generation of gaseous HCl, etc., to confine chlorine radicals generated from a triazine polymn. initiator in the reaction system and to suppress the occurrence of a mask deposit by adding epoxy resin to the photosensit...

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Hauptverfasser: IWAKURA SHUJI, TANI MIZUHITO, KUBOTA NAOHIRO, IRINO MARIKO
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creator IWAKURA SHUJI
TANI MIZUHITO
KUBOTA NAOHIRO
IRINO MARIKO
description PURPOSE: To ensure high sensitivity for a photosensitive compsn., to suppress the generation of gaseous HCl, etc., to confine chlorine radicals generated from a triazine polymn. initiator in the reaction system and to suppress the occurrence of a mask deposit by adding epoxy resin to the photosensitive compsn. CONSTITUTION: An epoxy resin is added to a photosensitive compsn. consisting of a coloring material, dispersant added acrylic resin, a photopolymerizable monomer, a triazine polymn. initiator and a solvent. The polymn. initiator is made of a mixture contg. at least one kind of triazine compd. and at least one kind of aminoacetophenone compd. The epoxy resin is added by an amt. (pts.wt.) 1/2 to 2 times the amt. of the polymn. initiator. The epoxy resin is, e.g. alicyclic epoxy resin, polyalcohol type epoxy resin, polyglycol type epoxy resin, bisphenol type epoxy resin or novolak type epoxy resin.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH0895238A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH0895238A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH0895238A3</originalsourceid><addsrcrecordid>eNrjZJAK8PAP8Q929Qv2DPEMc1Vw9vcN8Aex_f14GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8V4CHgYWlqZGxhaMxEUoALUEgnw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PHOTOSENSITIVE COMPOSITION</title><source>esp@cenet</source><creator>IWAKURA SHUJI ; TANI MIZUHITO ; KUBOTA NAOHIRO ; IRINO MARIKO</creator><creatorcontrib>IWAKURA SHUJI ; TANI MIZUHITO ; KUBOTA NAOHIRO ; IRINO MARIKO</creatorcontrib><description>PURPOSE: To ensure high sensitivity for a photosensitive compsn., to suppress the generation of gaseous HCl, etc., to confine chlorine radicals generated from a triazine polymn. initiator in the reaction system and to suppress the occurrence of a mask deposit by adding epoxy resin to the photosensitive compsn. CONSTITUTION: An epoxy resin is added to a photosensitive compsn. consisting of a coloring material, dispersant added acrylic resin, a photopolymerizable monomer, a triazine polymn. initiator and a solvent. The polymn. initiator is made of a mixture contg. at least one kind of triazine compd. and at least one kind of aminoacetophenone compd. The epoxy resin is added by an amt. (pts.wt.) 1/2 to 2 times the amt. of the polymn. initiator. The epoxy resin is, e.g. alicyclic epoxy resin, polyalcohol type epoxy resin, polyglycol type epoxy resin, bisphenol type epoxy resin or novolak type epoxy resin.</description><edition>6</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>1996</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19960412&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0895238A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19960412&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0895238A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>IWAKURA SHUJI</creatorcontrib><creatorcontrib>TANI MIZUHITO</creatorcontrib><creatorcontrib>KUBOTA NAOHIRO</creatorcontrib><creatorcontrib>IRINO MARIKO</creatorcontrib><title>PHOTOSENSITIVE COMPOSITION</title><description>PURPOSE: To ensure high sensitivity for a photosensitive compsn., to suppress the generation of gaseous HCl, etc., to confine chlorine radicals generated from a triazine polymn. initiator in the reaction system and to suppress the occurrence of a mask deposit by adding epoxy resin to the photosensitive compsn. CONSTITUTION: An epoxy resin is added to a photosensitive compsn. consisting of a coloring material, dispersant added acrylic resin, a photopolymerizable monomer, a triazine polymn. initiator and a solvent. The polymn. initiator is made of a mixture contg. at least one kind of triazine compd. and at least one kind of aminoacetophenone compd. The epoxy resin is added by an amt. (pts.wt.) 1/2 to 2 times the amt. of the polymn. initiator. The epoxy resin is, e.g. alicyclic epoxy resin, polyalcohol type epoxy resin, polyglycol type epoxy resin, bisphenol type epoxy resin or novolak type epoxy resin.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1996</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAK8PAP8Q929Qv2DPEMc1Vw9vcN8Aex_f14GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8V4CHgYWlqZGxhaMxEUoALUEgnw</recordid><startdate>19960412</startdate><enddate>19960412</enddate><creator>IWAKURA SHUJI</creator><creator>TANI MIZUHITO</creator><creator>KUBOTA NAOHIRO</creator><creator>IRINO MARIKO</creator><scope>EVB</scope></search><sort><creationdate>19960412</creationdate><title>PHOTOSENSITIVE COMPOSITION</title><author>IWAKURA SHUJI ; TANI MIZUHITO ; KUBOTA NAOHIRO ; IRINO MARIKO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH0895238A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1996</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>IWAKURA SHUJI</creatorcontrib><creatorcontrib>TANI MIZUHITO</creatorcontrib><creatorcontrib>KUBOTA NAOHIRO</creatorcontrib><creatorcontrib>IRINO MARIKO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>IWAKURA SHUJI</au><au>TANI MIZUHITO</au><au>KUBOTA NAOHIRO</au><au>IRINO MARIKO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PHOTOSENSITIVE COMPOSITION</title><date>1996-04-12</date><risdate>1996</risdate><abstract>PURPOSE: To ensure high sensitivity for a photosensitive compsn., to suppress the generation of gaseous HCl, etc., to confine chlorine radicals generated from a triazine polymn. initiator in the reaction system and to suppress the occurrence of a mask deposit by adding epoxy resin to the photosensitive compsn. CONSTITUTION: An epoxy resin is added to a photosensitive compsn. consisting of a coloring material, dispersant added acrylic resin, a photopolymerizable monomer, a triazine polymn. initiator and a solvent. The polymn. initiator is made of a mixture contg. at least one kind of triazine compd. and at least one kind of aminoacetophenone compd. The epoxy resin is added by an amt. (pts.wt.) 1/2 to 2 times the amt. of the polymn. initiator. The epoxy resin is, e.g. alicyclic epoxy resin, polyalcohol type epoxy resin, polyglycol type epoxy resin, bisphenol type epoxy resin or novolak type epoxy resin.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title PHOTOSENSITIVE COMPOSITION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T18%3A46%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=IWAKURA%20SHUJI&rft.date=1996-04-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH0895238A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true