MEASURING APPARATUS OF TRACE ELEMENT IN GAS

PURPOSE:To obtain a measuring apparatus by which a trace element in a high- temperature gas is measured in situ by a method wherein an ICP generation part and a light-receiving part are constituted respectively as freely detachable single units. CONSTITUTION:An ICP generation part 10, a solenoid 2 a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NAGAO YASUAKI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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