METHOD FOR ALTERING FILM THICKNESS MEASURING CONDITIONS OF WIRELESS FILM THICKNESS METER

PURPOSE: To achieve correct measurement of film thickness quickly by selecting a probe of either an electromagnetic type or a high frequency type and sending film thickness data to a measuring rotary body by radio communication to select or switch any one of constants or expressions. CONSTITUTION: I...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YUKI HIDEYASU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS SIGNALLING TARIFF METERING APPARATUS TESTING TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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