METHOD AND APPARATUS FOR MEASURING PLANARITY

METHOD AND APPARATUS FOR MEASURING PLANARITY

PURPOSE: To obtain an apparatus for measuring the planarity of a casting accurately, efficiently and economically without requiring any large surface plate, manual measuring system or the work for correcting the planarity of a plane to be measured. CONSTITUTION: A plane of a casting 9 to be measured...

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Hauptverfasser: OKAMOTO SHINICHIROU, YOSHIDA SHUJI, UMEMOTO KENJI, KISHIGAMI YOSHIAKI
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator OKAMOTO SHINICHIROU
YOSHIDA SHUJI
UMEMOTO KENJI
KISHIGAMI YOSHIAKI
description PURPOSE: To obtain an apparatus for measuring the planarity of a casting accurately, efficiently and economically without requiring any large surface plate, manual measuring system or the work for correcting the planarity of a plane to be measured. CONSTITUTION: A plane of a casting 9 to be measured is scanned circularly by means of a distance measuring sensor 2 to obtain a measurement of displacement at a constant angular interval. When the planarity is determined based on the measurements of displacement, an error component due to the shift in the parallelism of the plane to be measured from a circular plane is calculated and then the planarity is determined by correcting the error component.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title METHOD AND APPARATUS FOR MEASURING PLANARITY
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