SURFACE LAYER DEFECT DETECTING DEVICE

PURPOSE:To detect a stripe cavity vertical (laid along the circumferential direction) to the axis of a cylindrical surface layer at a high speed. CONSTITUTION:In the surface layer defect detecting device having a subject support device for rotating a subject 3 to be inspected having a cylindrical su...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KOBAYASHI MASANORI, HIRONO AYUMI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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