SURFACE LAYER DEFECT DETECTING DEVICE

SURFACE LAYER DEFECT DETECTING DEVICE

PURPOSE:To detect a stripe cavity vertical (laid along the circumferential direction) to the axis of a cylindrical surface layer at a high speed. CONSTITUTION:In the surface layer defect detecting device having a subject support device for rotating a subject 3 to be inspected having a cylindrical su...

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Hauptverfasser: KOBAYASHI MASANORI, HIRONO AYUMI
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator KOBAYASHI MASANORI
HIRONO AYUMI
description PURPOSE:To detect a stripe cavity vertical (laid along the circumferential direction) to the axis of a cylindrical surface layer at a high speed. CONSTITUTION:In the surface layer defect detecting device having a subject support device for rotating a subject 3 to be inspected having a cylindrical surface layer around its axis 3a, an inspecting light emitting device for emitting an inspecting light laid along the axial 3a direction to the cylindrical surface layer of the subject 3, and a light receiving sensor 13 for detecting the scattered reflected light quantity from the surface layer, the inspecting light emitting device has a projector for emitting the inspecting light from the vicinity of both axial ends of the subject 3 toward the center part of the subject 3 surface in the axial 3a direction.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title SURFACE LAYER DEFECT DETECTING DEVICE
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