METHOD FOR CUTTING SAMPLE FOR EMISSION ANALYSIS AND JIG FOR USE IN THE METHOD

METHOD FOR CUTTING SAMPLE FOR EMISSION ANALYSIS AND JIG FOR USE IN THE METHOD

PURPOSE:To uniform the depth of cut from the bottom surface of a sample and to shorten the time for installation by uniforming the projected length of a sample from a chuck portion throughout the sample. CONSTITUTION:To set up a sample 5 for emission analysis in the chuck portion 10 of a lathe in or...

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Hauptverfasser: WAKASAKI OSAMU, NAGASHIMA SHINTARO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator WAKASAKI OSAMU
NAGASHIMA SHINTARO
description PURPOSE:To uniform the depth of cut from the bottom surface of a sample and to shorten the time for installation by uniforming the projected length of a sample from a chuck portion throughout the sample. CONSTITUTION:To set up a sample 5 for emission analysis in the chuck portion 10 of a lathe in order to lathe the bottom surface 6 of the sample 5 whose main body is roughly cylindrical, the sample 5 is fitted to a jig 1, a portion of which is recessed with one end face allowing part of the sample to fit in and with a bottom surface parallel to the end face, while the bottom surface 6 of the sample abuts to the bottom surface 4 of the recess, and the recessed end face 3 of the jig 1 having the sample fitted thereto is brought into close contact with the end face 11 of the chuck portion of the lathe, and the side face portion 9 of the main body of the sample 5 which projects from the jig 1 is gripped by the chuck portion 10, and then the jig 1 is removed and the bottom surface 6 of the sample is lathed.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR CUTTING SAMPLE FOR EMISSION ANALYSIS AND JIG FOR USE IN THE METHOD
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