METHOD FOR CONTROLLING THICKNESS IN TANDEM MILL

PURPOSE:To shorten a control cycle and to improve the thickness accuracy. CONSTITUTION:The thickness deviation e4 from the target thickness on the outlet side of a 4th stand #4 from the detected value with a thickness measuring device SE5 which is arranged on the outlet side of at least one rolling...

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1. Verfasser: OI TOSHIYA
Format: Patent
Sprache:eng
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