GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER

PURPOSE:To obtain a GC/MS (gas chromatographic mass spectrometer) in which only a desorbed component can be analyzed by condensing a laser light or an infrared light locally thereby desorbing a contaminant from the local part. CONSTITUTION:Particles are desorbed tram the surface of a sample 4 by mea...

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Hauptverfasser: NAGASHIRO KAZUICHI, EGUCHI KINYA, AKAMATSU NAOTOSHI
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creator NAGASHIRO KAZUICHI
EGUCHI KINYA
AKAMATSU NAOTOSHI
description PURPOSE:To obtain a GC/MS (gas chromatographic mass spectrometer) in which only a desorbed component can be analyzed by condensing a laser light or an infrared light locally thereby desorbing a contaminant from the local part. CONSTITUTION:Particles are desorbed tram the surface of a sample 4 by means of a condensed laser light 6 and separated into components through chromatograph before being subjected to mass spectrometric analysis. In such GC/MS 1, the window of a sample chamber 3 is employed as a clean surface member for adsorbing the desorbed particles. After the particles are adsorbed to the surface of window, the sample 4 is taken out of the sample chamber 3 which is then heated entirely in order to liberate the adsorbed particles and to feed the liberated particles to a GC part.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH07318552A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH07318552A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH07318552A3</originalsourceid><addsrcrecordid>eNrjZLB2dwxWcPYI8vd1DPF3D3IM8FBw9HNRwBD1dFbwdQwOVggOcHUOAYq7hrgG8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeK8ADwNzY0MLU1MjR2Ni1AAA6rMppg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER</title><source>esp@cenet</source><creator>NAGASHIRO KAZUICHI ; EGUCHI KINYA ; AKAMATSU NAOTOSHI</creator><creatorcontrib>NAGASHIRO KAZUICHI ; EGUCHI KINYA ; AKAMATSU NAOTOSHI</creatorcontrib><description>PURPOSE:To obtain a GC/MS (gas chromatographic mass spectrometer) in which only a desorbed component can be analyzed by condensing a laser light or an infrared light locally thereby desorbing a contaminant from the local part. CONSTITUTION:Particles are desorbed tram the surface of a sample 4 by means of a condensed laser light 6 and separated into components through chromatograph before being subjected to mass spectrometric analysis. In such GC/MS 1, the window of a sample chamber 3 is employed as a clean surface member for adsorbing the desorbed particles. After the particles are adsorbed to the surface of window, the sample 4 is taken out of the sample chamber 3 which is then heated entirely in order to liberate the adsorbed particles and to feed the liberated particles to a GC part.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19951208&amp;DB=EPODOC&amp;CC=JP&amp;NR=H07318552A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19951208&amp;DB=EPODOC&amp;CC=JP&amp;NR=H07318552A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAGASHIRO KAZUICHI</creatorcontrib><creatorcontrib>EGUCHI KINYA</creatorcontrib><creatorcontrib>AKAMATSU NAOTOSHI</creatorcontrib><title>GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER</title><description>PURPOSE:To obtain a GC/MS (gas chromatographic mass spectrometer) in which only a desorbed component can be analyzed by condensing a laser light or an infrared light locally thereby desorbing a contaminant from the local part. CONSTITUTION:Particles are desorbed tram the surface of a sample 4 by means of a condensed laser light 6 and separated into components through chromatograph before being subjected to mass spectrometric analysis. In such GC/MS 1, the window of a sample chamber 3 is employed as a clean surface member for adsorbing the desorbed particles. After the particles are adsorbed to the surface of window, the sample 4 is taken out of the sample chamber 3 which is then heated entirely in order to liberate the adsorbed particles and to feed the liberated particles to a GC part.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB2dwxWcPYI8vd1DPF3D3IM8FBw9HNRwBD1dFbwdQwOVggOcHUOAYq7hrgG8TCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeK8ADwNzY0MLU1MjR2Ni1AAA6rMppg</recordid><startdate>19951208</startdate><enddate>19951208</enddate><creator>NAGASHIRO KAZUICHI</creator><creator>EGUCHI KINYA</creator><creator>AKAMATSU NAOTOSHI</creator><scope>EVB</scope></search><sort><creationdate>19951208</creationdate><title>GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER</title><author>NAGASHIRO KAZUICHI ; EGUCHI KINYA ; AKAMATSU NAOTOSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH07318552A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1995</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAGASHIRO KAZUICHI</creatorcontrib><creatorcontrib>EGUCHI KINYA</creatorcontrib><creatorcontrib>AKAMATSU NAOTOSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAGASHIRO KAZUICHI</au><au>EGUCHI KINYA</au><au>AKAMATSU NAOTOSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER</title><date>1995-12-08</date><risdate>1995</risdate><abstract>PURPOSE:To obtain a GC/MS (gas chromatographic mass spectrometer) in which only a desorbed component can be analyzed by condensing a laser light or an infrared light locally thereby desorbing a contaminant from the local part. CONSTITUTION:Particles are desorbed tram the surface of a sample 4 by means of a condensed laser light 6 and separated into components through chromatograph before being subjected to mass spectrometric analysis. In such GC/MS 1, the window of a sample chamber 3 is employed as a clean surface member for adsorbing the desorbed particles. After the particles are adsorbed to the surface of window, the sample 4 is taken out of the sample chamber 3 which is then heated entirely in order to liberate the adsorbed particles and to feed the liberated particles to a GC part.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title GAS CHROMATOGRAPH AND GAS CHROMATOGRAPHIC MASS SPECTROMETER
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T20%3A25%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAGASHIRO%20KAZUICHI&rft.date=1995-12-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH07318552A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true