ELEMENT ANALYSER
PURPOSE:To provide an element analyser, by which analysis can be accomplished with high accuracy even in the case of measuring an element contained in an organic matter. CONSTITUTION:A liquid sample TP composed of an organic matter is burnt by a burning means 1, and the carbon component of the burnt...
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| creator | NISHI NOBUHIKO NANBU MASAYUKI MASUDA TETSUYA |
| description | PURPOSE:To provide an element analyser, by which analysis can be accomplished with high accuracy even in the case of measuring an element contained in an organic matter. CONSTITUTION:A liquid sample TP composed of an organic matter is burnt by a burning means 1, and the carbon component of the burnt sample becomes carbon dioxide, so that the burnt sample is supplied as evaporated gas to the next carbon dioxide removing means 2. As only the carbon dioxide of the evaporated sample is removed by the carbon dioxide gas removing means 2, only the evaporated sample from which a carbon component is removed is supplied to a plasma torch 3. |
| format | Patent |
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CONSTITUTION:A liquid sample TP composed of an organic matter is burnt by a burning means 1, and the carbon component of the burnt sample becomes carbon dioxide, so that the burnt sample is supplied as evaporated gas to the next carbon dioxide removing means 2. As only the carbon dioxide of the evaporated sample is removed by the carbon dioxide gas removing means 2, only the evaporated sample from which a carbon component is removed is supplied to a plasma torch 3.</description><edition>6</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950801&DB=EPODOC&CC=JP&NR=H07198613A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950801&DB=EPODOC&CC=JP&NR=H07198613A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHI NOBUHIKO</creatorcontrib><creatorcontrib>NANBU MASAYUKI</creatorcontrib><creatorcontrib>MASUDA TETSUYA</creatorcontrib><title>ELEMENT ANALYSER</title><description>PURPOSE:To provide an element analyser, by which analysis can be accomplished with high accuracy even in the case of measuring an element contained in an organic matter. CONSTITUTION:A liquid sample TP composed of an organic matter is burnt by a burning means 1, and the carbon component of the burnt sample becomes carbon dioxide, so that the burnt sample is supplied as evaporated gas to the next carbon dioxide removing means 2. As only the carbon dioxide of the evaporated sample is removed by the carbon dioxide gas removing means 2, only the evaporated sample from which a carbon component is removed is supplied to a plasma torch 3.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBw9XH1dfULUXD0c_SJDHYN4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgbmhpYWZobGjsbEqAEACwQdyA</recordid><startdate>19950801</startdate><enddate>19950801</enddate><creator>NISHI NOBUHIKO</creator><creator>NANBU MASAYUKI</creator><creator>MASUDA TETSUYA</creator><scope>EVB</scope></search><sort><creationdate>19950801</creationdate><title>ELEMENT ANALYSER</title><author>NISHI NOBUHIKO ; NANBU MASAYUKI ; MASUDA TETSUYA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH07198613A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1995</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHI NOBUHIKO</creatorcontrib><creatorcontrib>NANBU MASAYUKI</creatorcontrib><creatorcontrib>MASUDA TETSUYA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHI NOBUHIKO</au><au>NANBU MASAYUKI</au><au>MASUDA TETSUYA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELEMENT ANALYSER</title><date>1995-08-01</date><risdate>1995</risdate><abstract>PURPOSE:To provide an element analyser, by which analysis can be accomplished with high accuracy even in the case of measuring an element contained in an organic matter. CONSTITUTION:A liquid sample TP composed of an organic matter is burnt by a burning means 1, and the carbon component of the burnt sample becomes carbon dioxide, so that the burnt sample is supplied as evaporated gas to the next carbon dioxide removing means 2. As only the carbon dioxide of the evaporated sample is removed by the carbon dioxide gas removing means 2, only the evaporated sample from which a carbon component is removed is supplied to a plasma torch 3.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | ELEMENT ANALYSER |
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