SAMPLE HEATER OF X-RAY EQUIPMENT
PURPOSE:To provide a sample heater allowing accurate X-ray measurement to be performed while heating a sample in which the sample can be loaded vary easily without causing any damage. CONSTITUTION:The sample heater is employed in an X-ray equipment for measuring a sample 7 by detecting X-rays diffra...
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creator | OZAWA GIICHI |
description | PURPOSE:To provide a sample heater allowing accurate X-ray measurement to be performed while heating a sample in which the sample can be loaded vary easily without causing any damage. CONSTITUTION:The sample heater is employed in an X-ray equipment for measuring a sample 7 by detecting X-rays diffracted therefrom upon irradiation with X-rays. The sample heater comprises a sample plate 1 for mounting the sample 7 while touching, a suction hole 20 made through the sample plate 1, an exhaust pump 32 for sucking air through the suction hole 20, and a heater 25 built in the sample plate 1 in order to heat the sample plate 1. |
format | Patent |
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CONSTITUTION:The sample heater is employed in an X-ray equipment for measuring a sample 7 by detecting X-rays diffracted therefrom upon irradiation with X-rays. The sample heater comprises a sample plate 1 for mounting the sample 7 while touching, a suction hole 20 made through the sample plate 1, an exhaust pump 32 for sucking air through the suction hole 20, and a heater 25 built in the sample plate 1 in order to heat the sample plate 1.</description><edition>6</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950623&DB=EPODOC&CC=JP&NR=H07159300A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950623&DB=EPODOC&CC=JP&NR=H07159300A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OZAWA GIICHI</creatorcontrib><title>SAMPLE HEATER OF X-RAY EQUIPMENT</title><description>PURPOSE:To provide a sample heater allowing accurate X-ray measurement to be performed while heating a sample in which the sample can be loaded vary easily without causing any damage. CONSTITUTION:The sample heater is employed in an X-ray equipment for measuring a sample 7 by detecting X-rays diffracted therefrom upon irradiation with X-rays. The sample heater comprises a sample plate 1 for mounting the sample 7 while touching, a suction hole 20 made through the sample plate 1, an exhaust pump 32 for sucking air through the suction hole 20, and a heater 25 built in the sample plate 1 in order to heat the sample plate 1.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAIdvQN8HFV8HB1DHENUvB3U4jQDXKMVHANDPUM8HX1C-FhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfFeAR4G5oamlsYGBo7GxKgBAOrpIfQ</recordid><startdate>19950623</startdate><enddate>19950623</enddate><creator>OZAWA GIICHI</creator><scope>EVB</scope></search><sort><creationdate>19950623</creationdate><title>SAMPLE HEATER OF X-RAY EQUIPMENT</title><author>OZAWA GIICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH07159300A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1995</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OZAWA GIICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OZAWA GIICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SAMPLE HEATER OF X-RAY EQUIPMENT</title><date>1995-06-23</date><risdate>1995</risdate><abstract>PURPOSE:To provide a sample heater allowing accurate X-ray measurement to be performed while heating a sample in which the sample can be loaded vary easily without causing any damage. CONSTITUTION:The sample heater is employed in an X-ray equipment for measuring a sample 7 by detecting X-rays diffracted therefrom upon irradiation with X-rays. The sample heater comprises a sample plate 1 for mounting the sample 7 while touching, a suction hole 20 made through the sample plate 1, an exhaust pump 32 for sucking air through the suction hole 20, and a heater 25 built in the sample plate 1 in order to heat the sample plate 1.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | SAMPLE HEATER OF X-RAY EQUIPMENT |
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