JPH067052B
PURPOSE:To lead out a signal current which has distance information propor tional to the quantity of variation in the distance of a body to be measured by dividing the resistance layer on the surface of a position detector. CONSTITUTION:This position detector is constituted by providing an N layer 2...
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creator | HORIGUCHI CHOHARU |
description | PURPOSE:To lead out a signal current which has distance information propor tional to the quantity of variation in the distance of a body to be measured by dividing the resistance layer on the surface of a position detector. CONSTITUTION:This position detector is constituted by providing an N layer 23 forming a common terminal on the reverse side of a silicon substrate 22, insulating and separating a rectangular P layer which becomes a photodetection surface of the top side, and arranging signal current lead-out terminals 12 and 13 on the P layers 15 and 16. Then, H(X)+W(X)+I=W and W(X)=ax/(x+b) hold at a position which is X away from the side of the photodetection surface on a light-source side. Wherein, W is the width of the position detector, I the length of the breadthwise separation layer, H(X) the breadthwise length of the photodetection surface on the light-source side, W(X) the breadthwise length of the photodetection surface on the other side, and (a) and (b) constants, which are so defined that a=Lf(W-I)/(Lf-Ln) and b=(f.B)/Lf (where Ln is the short- distance side distance measurement limit, Lf the long-distance side distance measurement limit, B the length of a base line, and (f) image formation length). The position of the body to be measured can be detected from those equations. |
format | Patent |
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CONSTITUTION:This position detector is constituted by providing an N<+> layer 23 forming a common terminal on the reverse side of a silicon substrate 22, insulating and separating a rectangular P layer which becomes a photodetection surface of the top side, and arranging signal current lead-out terminals 12 and 13 on the P layers 15 and 16. Then, H(X)+W(X)+I=W and W(X)=ax/(x+b) hold at a position which is X away from the side of the photodetection surface on a light-source side. Wherein, W is the width of the position detector, I the length of the breadthwise separation layer, H(X) the breadthwise length of the photodetection surface on the light-source side, W(X) the breadthwise length of the photodetection surface on the other side, and (a) and (b) constants, which are so defined that a=Lf(W-I)/(Lf-Ln) and b=(f.B)/Lf (where Ln is the short- distance side distance measurement limit, Lf the long-distance side distance measurement limit, B the length of a base line, and (f) image formation length). The position of the body to be measured can be detected from those equations.</description><edition>5</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GYROSCOPIC INSTRUMENTS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING DISTANCES, LEVELS OR BEARINGS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; NAVIGATION ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHOTOGRAMMETRY OR VIDEOGRAMMETRY ; PHYSICS ; SEMICONDUCTOR DEVICES ; SURVEYING ; TESTING</subject><creationdate>1994</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940126&DB=EPODOC&CC=JP&NR=H067052B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940126&DB=EPODOC&CC=JP&NR=H067052B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HORIGUCHI CHOHARU</creatorcontrib><title>JPH067052B</title><description>PURPOSE:To lead out a signal current which has distance information propor tional to the quantity of variation in the distance of a body to be measured by dividing the resistance layer on the surface of a position detector. CONSTITUTION:This position detector is constituted by providing an N<+> layer 23 forming a common terminal on the reverse side of a silicon substrate 22, insulating and separating a rectangular P layer which becomes a photodetection surface of the top side, and arranging signal current lead-out terminals 12 and 13 on the P layers 15 and 16. Then, H(X)+W(X)+I=W and W(X)=ax/(x+b) hold at a position which is X away from the side of the photodetection surface on a light-source side. Wherein, W is the width of the position detector, I the length of the breadthwise separation layer, H(X) the breadthwise length of the photodetection surface on the light-source side, W(X) the breadthwise length of the photodetection surface on the other side, and (a) and (b) constants, which are so defined that a=Lf(W-I)/(Lf-Ln) and b=(f.B)/Lf (where Ln is the short- distance side distance measurement limit, Lf the long-distance side distance measurement limit, B the length of a base line, and (f) image formation length). The position of the body to be measured can be detected from those equations.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GYROSCOPIC INSTRUMENTS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING DISTANCES, LEVELS OR BEARINGS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>NAVIGATION</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURVEYING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1994</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZODyCvAwMDM3MDVy4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8QgNTkbGxKgBAC_7G50</recordid><startdate>19940126</startdate><enddate>19940126</enddate><creator>HORIGUCHI CHOHARU</creator><scope>EVB</scope></search><sort><creationdate>19940126</creationdate><title>JPH067052B</title><author>HORIGUCHI CHOHARU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH067052BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1994</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GYROSCOPIC INSTRUMENTS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING DISTANCES, LEVELS OR BEARINGS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>NAVIGATION</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURVEYING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HORIGUCHI CHOHARU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HORIGUCHI CHOHARU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JPH067052B</title><date>1994-01-26</date><risdate>1994</risdate><abstract>PURPOSE:To lead out a signal current which has distance information propor tional to the quantity of variation in the distance of a body to be measured by dividing the resistance layer on the surface of a position detector. CONSTITUTION:This position detector is constituted by providing an N<+> layer 23 forming a common terminal on the reverse side of a silicon substrate 22, insulating and separating a rectangular P layer which becomes a photodetection surface of the top side, and arranging signal current lead-out terminals 12 and 13 on the P layers 15 and 16. Then, H(X)+W(X)+I=W and W(X)=ax/(x+b) hold at a position which is X away from the side of the photodetection surface on a light-source side. Wherein, W is the width of the position detector, I the length of the breadthwise separation layer, H(X) the breadthwise length of the photodetection surface on the light-source side, W(X) the breadthwise length of the photodetection surface on the other side, and (a) and (b) constants, which are so defined that a=Lf(W-I)/(Lf-Ln) and b=(f.B)/Lf (where Ln is the short- distance side distance measurement limit, Lf the long-distance side distance measurement limit, B the length of a base line, and (f) image formation length). The position of the body to be measured can be detected from those equations.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY GYROSCOPIC INSTRUMENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NAVIGATION OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SEMICONDUCTOR DEVICES SURVEYING TESTING |
title | JPH067052B |
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