APPEARANCE INSPECTION APPARATUS OF ELECTRONIC COMPONENT

PURPOSE:To obtain the appearance inspection apparatus, of an electronic component, wherein a defective part can be specified with high accuracy. CONSTITUTION:On the basis of image data obtained by sensing the image of an electronic component C by a camera 1 while the component is illuminated with an...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SHIMIZU TOSHIMICHI, TANAKA KAZUYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING
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