PROBE UNIT AND MANUFACTURE THEREOF

PURPOSE:To provide a probe unit and manufacturing method thereof in which the contact of pins can be prevented by enhancing strength against external force when a quite thin metal wire having a diameter shorter than a specified value is employed as a probe pin, fine pitch can be dealt with while enh...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YUZUTORI TAKAAKI, OKUMURA TOSHIAKI, HARA NOBUHIRO, HINO TSUTOMU, MUNEYOSHI TOSHIHIKO, NAKAO MASAKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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