FORMATION OF MASK PATTERN
PURPOSE:To improve quality control by adding dummy patterns to the pattern corresponding to parts which are defective devices, thereby deciding the parts transferred with these patterns always as defective as thes parts do not function as a circuit. CONSTITUTION:The mask pattern is so constituted th...
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creator | MORIYAMA NORIO |
description | PURPOSE:To improve quality control by adding dummy patterns to the pattern corresponding to parts which are defective devices, thereby deciding the parts transferred with these patterns always as defective as thes parts do not function as a circuit. CONSTITUTION:The mask pattern is so constituted that device patterns A can be transferred to the entire part of a wafer 5 with a shot 4 as one unit in the same manner as heretofore on a master mask 3. Such patterns B which do not function as circuit patterns, i.e., as devices when transferred, for example, the square patterns painted solid black, are, thereupon, superposed and arranged on the device patterns A having the parts protruding from the wafer 5, i.e. the parts where the outer peripheral part of the wafer 5 passes in the device patterns A and the so-called defect patterns are formed, namely, the defective parts. The arrangement and shapes of such dummy patterns are formed as the patterns, painted solid black, to a rectangular shape nearly analogous with the shape of the small patterns A of several hundred mum of one side. |
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CONSTITUTION:The mask pattern is so constituted that device patterns A can be transferred to the entire part of a wafer 5 with a shot 4 as one unit in the same manner as heretofore on a master mask 3. Such patterns B which do not function as circuit patterns, i.e., as devices when transferred, for example, the square patterns painted solid black, are, thereupon, superposed and arranged on the device patterns A having the parts protruding from the wafer 5, i.e. the parts where the outer peripheral part of the wafer 5 passes in the device patterns A and the so-called defect patterns are formed, namely, the defective parts. The arrangement and shapes of such dummy patterns are formed as the patterns, painted solid black, to a rectangular shape nearly analogous with the shape of the small patterns A of several hundred mum of one side.</description><edition>5</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>1994</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940726&DB=EPODOC&CC=JP&NR=H06208220A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940726&DB=EPODOC&CC=JP&NR=H06208220A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MORIYAMA NORIO</creatorcontrib><title>FORMATION OF MASK PATTERN</title><description>PURPOSE:To improve quality control by adding dummy patterns to the pattern corresponding to parts which are defective devices, thereby deciding the parts transferred with these patterns always as defective as thes parts do not function as a circuit. CONSTITUTION:The mask pattern is so constituted that device patterns A can be transferred to the entire part of a wafer 5 with a shot 4 as one unit in the same manner as heretofore on a master mask 3. Such patterns B which do not function as circuit patterns, i.e., as devices when transferred, for example, the square patterns painted solid black, are, thereupon, superposed and arranged on the device patterns A having the parts protruding from the wafer 5, i.e. the parts where the outer peripheral part of the wafer 5 passes in the device patterns A and the so-called defect patterns are formed, namely, the defective parts. The arrangement and shapes of such dummy patterns are formed as the patterns, painted solid black, to a rectangular shape nearly analogous with the shape of the small patterns A of several hundred mum of one side.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1994</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB08w_ydQzx9PdT8HdT8HUM9lYIcAwJcQ3y42FgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgZmRgYWRkYGjsbEqAEAFCEgGA</recordid><startdate>19940726</startdate><enddate>19940726</enddate><creator>MORIYAMA NORIO</creator><scope>EVB</scope></search><sort><creationdate>19940726</creationdate><title>FORMATION OF MASK PATTERN</title><author>MORIYAMA NORIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH06208220A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1994</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>MORIYAMA NORIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MORIYAMA NORIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FORMATION OF MASK PATTERN</title><date>1994-07-26</date><risdate>1994</risdate><abstract>PURPOSE:To improve quality control by adding dummy patterns to the pattern corresponding to parts which are defective devices, thereby deciding the parts transferred with these patterns always as defective as thes parts do not function as a circuit. CONSTITUTION:The mask pattern is so constituted that device patterns A can be transferred to the entire part of a wafer 5 with a shot 4 as one unit in the same manner as heretofore on a master mask 3. Such patterns B which do not function as circuit patterns, i.e., as devices when transferred, for example, the square patterns painted solid black, are, thereupon, superposed and arranged on the device patterns A having the parts protruding from the wafer 5, i.e. the parts where the outer peripheral part of the wafer 5 passes in the device patterns A and the so-called defect patterns are formed, namely, the defective parts. The arrangement and shapes of such dummy patterns are formed as the patterns, painted solid black, to a rectangular shape nearly analogous with the shape of the small patterns A of several hundred mum of one side.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | FORMATION OF MASK PATTERN |
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