FLUORESCENT X-RAYS FILM THICKNESS MEASURING METHOD

PURPOSE:To allow high speed automatic determination of the measuring position of sample by observing variation of the intensity of fluorescent X-ray accumulated at respective positions while scanning a fine sample by means of primary X-ray and then comparing the observed value with a predicted value...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	TASHIRO HIROMI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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