SCAN-PATH CIRCUIT

PURPOSE:To greatly shorten the time from the interruption to the restart of an error processing by making the number of shift clocks, required to scan all scan paths, much less than that in a case wherein the scan paths can be put in operation only individually. CONSTITUTION:Scan-path circuits SP1 a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NOBUTAKA YASUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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