PASS FALL DECIDING DEVICE FOR INTEGRATED CIRCUIT

PURPOSE:To make it possible to verify functions of an integrated circuit even in a simple pass fail deciding device or even for integrated circuits forced to test under mixed conditions of passes and fails by enabling tests even when an expected value of a test is either pass or fail. CONSTITUTION:I...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KURAMOTO FUMIO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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